X-rays have been used by physicists, chemists, metallurgists, biologists, crystallographers and materials scientists to study a wide range of materials. Consequently, the results of such research are widely scattered throughout a variety of scientific journals of different disciplines. This second volume of Recent Advances in X-ray Characterization of Materials , together with the first volume published in 1987, reviews the scientific literature, presenting the results in a form especially convenient for the scientist seeking information on research in disciplines other than his own.
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Book Description Pergamon Pr, 1989. Hardcover. Book Condition: Good. Bookseller Inventory # mon0000410892
Book Description Book Condition: Good. Book Condition: Good. Bookseller Inventory # 97800803736834.0