As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging.
Topics include:**failure analysis techniques**radiation effects**reliability assurance and qualification
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Book Description Book Condition: Good. [ No Hassle 30 Day Returns ][ Ships Daily ] [ Underlining/Highlighting: NONE ] [ Writing: SOME ] [ Edition: first ] old library book Publisher: Academic Press Pub Date: 4/11/1990 Binding: Hardcover Pages: 207 first edition. Bookseller Inventory # 4157658
Book Description Academic Press, 1990. Book Condition: Good. 207 pp., Hardcover, ex library, else text clean and binding tight. Bookseller Inventory # ZB896359
Book Description Academic Press Inc, 1990. Book Condition: Good. Volume 22. Volume 2. This book has hardback covers.Ex-library,With usual stamps and markings,In good all round condition.No dust jacket. Bookseller Inventory # 2200983
Book Description Academic Press, 1990. Book Condition: very good. Gently used. Expect delivery in 20 days. Bookseller Inventory # 9780122341229-3
Book Description Academic Press, San Diego, 1990. Original Cloth. 1st Edition. 23 x 15 cm., xiii, 207 pp. The book is covered in green cloth with black lettering on the spine and front. CONDITION. VG+/ no dj. The pages are clean and tight. Slight rubbing of corners and ends of the spine. Library marks and labels on spine and front end papers. Label on free end paper has caused wrinking. Library stamp on fore edge. Ex-Library. Bookseller Inventory # 002759