This is the first comprehensive and unified treatment to describe the physical principles behind experimental techniques used for measuring the electrical properties of semiconductors. The principles involved are illustrated by reference to selected examples drawn from the world of semiconductor materials. By concentrating on the physical principles of each technique and enumerating its inherent limitations the authors have produced a text that will be helpful in solving a variety of problems in semiconductor characterization and one that will not be quickly outdated by developments in the materials themselves.
Emphasizes the physics and theory underlying the experimental characterization of semicondutors**Deals with the measurement of minority lifetimes and diffusion length**Discusses electrical and optical methods***INCLUDED IN PHYSICS TODAY, SEPT 90***INCLUDED IN MRS BULLETIN, NOVEMBER 90***INCLUDED IN JRNL OF VACUUM SCI, DECEMBER 90***INCLUDED IN PHYSICS TODAY, FEBRUARY 91
"synopsis" may belong to another edition of this title.
Book Description Academic Press, St Louis, Missouri, U.S.A., 1992. Hard Cover. Book Condition: Very Good. Hardcover book is very good plus with shelfwear and the owner's name inside both covers. Issued without a dust jacket. A nice example of a very scarce resource. Expedited international shipping is not available. The delivery expectation for international shipping is 7-32 business days, depending upon customer location. Bookseller Inventory # 005357
Book Description Academic Press, 1990. Book Condition: Very Good. N/A. Ships from the UK. Former Library book. Great condition for a used book! Minimal wear. Bookseller Inventory # GRP91910246
Book Description Book Condition: Good. The Electrical Characterization of Semiconductors: Measurement of Minority Carrier Properties (Techniques of Physics). Bookseller Inventory # Amz4982481