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IEEE ED/SSC Chapter, Bangalore

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2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuit Ipfa 2007

IEEE ED/SSC Chapter, Bangalore; Souvik Mahapatra; IEEE Electron Devices Society; M. K. Radhakrishnan; IEEE Reliability/CPMT/ED Singapore Chapter; IEEE ED/AP Chapter, Bombay

ISBN:

9781424410149

Publisher:

IEEE

Publication Date:

2008

Binding:

Softcover

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