Home > IEEE Reliability/CPMT/ED Singapore Chapter

IEEE Reliability/CPMT/ED Singapore Chapter

Bibliography:

Image Not Available

2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuit Ipfa 2007

IEEE Reliability/CPMT/ED Singapore Chapter; Souvik Mahapatra; IEEE Electron Devices Society; M. K. Radhakrishnan; IEEE ED/SSC Chapter, Bangalore; IEEE ED/AP Chapter, Bombay

ISBN:

9781424410149

Publisher:

IEEE

Publication Date:

2008

Binding:

Softcover

More About this Book | View All Listings | View Collectible Listings

Other editions: Softcover - 2007, 2004, 2004, 2003, 2000, Hardcover - 1998

More IEEE Reliability/CPMT/ED Singapore Chapter Books:

› View all listings IEEE Reliability/CPMT/ED Singapore Chapter

› View all first editions IEEE Reliability/CPMT/ED Singapore Chapter

› View all signed copies IEEE Reliability/CPMT/ED Singapore Chapter

› View all collectible copies IEEE Reliability/CPMT/ED Singapore Chapter

IEEE Reliability/CPMT/ED Singapore Chapter Books:

› All Listings for IEEE Reliability/CPMT/ED Singapore Chapter

› First Edition IEEE Reliability/CPMT/ED Singapore Chapter

› Signed IEEE Reliability/CPMT/ED Singapore Chapter

› Collectible IEEE Reliability/CPMT/ED Singapore Chapter

Portions of this page may be (c) 2006 Muze Inc. Some database content may also be provided by Baker & Taylor Inc. Copyright 1995-2006 Muze Inc. For personal non-commercial use only. All rights reserved. Content for books is owned by Baker & Taylor, Inc. or its licensors and is subject to copyright and all other protections provided by applicable law.

Portions of this page may be Copyright VNU Entertainment Media (UK) Ltd., 2006, Georg Lingenbrink GmbH & Co., Tite Live, S.A or Informazioni Editoriali S.p.A. All rights reserved.