9780769520049

Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing, 28-29 July, 2003, San Jose, California

Tom Wit; Rochit Rajsuman; IEEE Computer Society; IEEE Solid-State Circuits Society; Adit Singh

ISBN 10: 0769520049 / 0-7695-2004-9
ISBN 13: 9780769520049
Publisher: IEEE Computer Society
Publication Date: 2003