9780780327986
Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Soon Huat Ong; IEEE Electron Devices Society; M. K. Radhakrishnan; National University of Singapore; IEEE Singapore Section; Institute of Microelectronics; Magnetics Technology Centre
ISBN 10: 0780327985 / 0-7803-2798-5
ISBN 13: 9780780327986
Publisher: Institute of Electrical and Electronics Engineers
Publication Date: 1995
ISBN 13: 9780780327986
Publisher: Institute of Electrical and Electronics Engineers
Publication Date: 1995
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