9780780377226
Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits: IPFA 2003 [scheduled, 7 to 11 July, 2003, Singapore]
Philip Ho; IEEE Electron Devices Society; IEEE Reliability Society; National University of Singapore; IEEE Reliability/CPMT/ED Singapore Chapter
ISBN 10: 0780377222 / 0-7803-7722-2
ISBN 13: 9780780377226
Publisher: IEEE
Publication Date: 2003
ISBN 13: 9780780377226
Publisher: IEEE
Publication Date: 2003
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