9780819441072
In-line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II
Society of Photo-Optical Instrumentation Engineers; Gudrun Kissinger; Larg H. Weiland; Institution of Electrical Engineers; European Optical Society; Scottish Enterprise; Larg H. Weiland
ISBN 13: 9780819441072
Publisher: Society of Photo Optical
Publication Date: 2001
Binding: Softcover
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In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing (Proceedings / SPIE--the International Society for Optical Engineering) (ISBN: 0819441074 / 0-8194-4107-4) Society of Photo-Optical Instrumentation Engineers;Kissinger, Gudrun;H. Weiland, Larg;Institution of Electrical Engineers;European Optical Society;Scottish Enterprise;Weiland, Larg H. Quantity Available: 2
Book Description: SPIE-International Society for Optical Engine, 2001. Paperback. Book Condition: Brand New. illustrated edition. 252 pages. 10.60x8.30x0.60 inches. In Stock. Bookseller Inventory # 0819441074 Bookseller & Payment Information | More Books from this Seller | Ask Bookseller a Question |
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