
9781424410149
2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuit Ipfa 2007
Souvik Mahapatra; IEEE Electron Devices Society; M. K. Radhakrishnan; IEEE Reliability/CPMT/ED Singapore Chapter; IEEE ED/SSC Chapter, Bangalore; IEEE ED/AP Chapter, Bombay
ISBN 13: 9781424410149
Publisher: IEEE
Publication Date: 2008
Binding: Softcover
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