1996 IEEE International Test Conference (Itc (International Test Conference//Proceedings)

International Test Conference (1996 : Washington D. C)

Published by Ieee
ISBN 10: 0780335406 / ISBN 13: 9780780335400
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Synopsis: ITC is the World's largest premier technical conference on the testing and total quality of integrated electronics and the assenblies and systems that are based on them.

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Title: 1996 IEEE International Test Conference (Itc...
Publisher: Ieee
Binding: Hardcover
Book Condition: Good

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International Test Conference (1996 : Washington D. C)
Published by Ieee (1997)
ISBN 10: 0780335406 ISBN 13: 9780780335400
New Hardcover Quantity Available: 1
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Book Description Ieee, 1997. Hardcover. Book Condition: New. Bookseller Inventory # DADAX0780335406

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