Materials Science in Microelectronics I, Second Edition: The Relationships Between Thin Film Processing and Structure

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9780080446400: Materials Science in Microelectronics I, Second Edition: The Relationships Between Thin Film Processing and Structure

Thin films play a key role in the material science of microelectronics, and the subject matter of thin-films divides naturally into two headings: processing / structure relationship, and structure / properties relationship.

The first volume of Materials Science in Microelectronics focuses on the first relationship – that between processing and the structure of the thin-film. The state of the thin film’s surface during the period that one monolayer exists - before being buried in the next layer – determines the ultimate structure of the thin film, and thus its properties. This volume takes into consideration the following potential influencing factors: crystal defects, void structure, grain structure, interface structure in epitaxial films, the structure of amorphous films, and reaction-induced structure.

An ideal text or reference work for students and researchers in material science, who need to learn the basics of thin films.

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Book Description ELSEVIER SCIENCE TECHNOLOGY, United Kingdom, 2005. Hardback. Book Condition: New. 2nd Revised edition. 228 x 156 mm. Language: English . Brand New Book. Thin films play a key role in the material science of microelectronics, and the subject matter of thin-films divides naturally into two headings: processing / structure relationship, and structure / properties relationship. The first volume of Materials Science in Microelectronics focuses on the first relationship - that between processing and the structure of the thin-film. The state of the thin film s surface during the period that one monolayer exists - before being buried in the next layer - determines the ultimate structure of the thin film, and thus its properties. This volume takes into consideration the following potential influencing factors: crystal defects, void structure, grain structure, interface structure in epitaxial films, the structure of amorphous films, and reaction-induced structure. An ideal text or reference work for students and researchers in material science, who need to learn the basics of thin films. Bookseller Inventory # AA59780080446400

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Book Description ELSEVIER SCIENCE TECHNOLOGY, United Kingdom, 2005. Hardback. Book Condition: New. 2nd Revised edition. 228 x 156 mm. Language: English . Brand New Book. Thin films play a key role in the material science of microelectronics, and the subject matter of thin-films divides naturally into two headings: processing/structure relationship, and structure/properties relationship. The first volume of Materials Science in Microelectronics focuses on the first relationship - that between processing and the structure of the thin-film. The state of the thin film s surface during the period that one monolayer exists - before being buried in the next layer - determines the ultimate structure of the thin film, and thus its properties. This volume takes into consideration the following potential influencing factors: crystal defects, void structure, grain structure, interface structure in epitaxial films, the structure of amorphous films, and reaction-induced structure. This is an ideal text or reference work for students and researchers in material science, who need to learn the basics of thin films. Bookseller Inventory # AA59780080446400

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