Advances in Imaging and Electron Physics, Volume 130 (Advances in Imaging & Electron Physics)

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9780120147724: Advances in Imaging and Electron Physics, Volume 130 (Advances in Imaging & Electron Physics)

The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics.

Several of these topics are covered in this volume, which opens with a long
chapter of monograph stature on quantitative electron microscopy at the
atomic resolution level by scientists from a well-known and very
distinguished Antwerp University Laboratory. This is unique in that the
statistical aspects are explored fully. This is followed by a contribution
by A.M. Grigoryan and S.S. Again on transform-based image enhancement,
covering both frequency-ordered systems and tensor approaches. The volume
concludes with an account of the problems of image registration and ways of
solving them by Maria Petrou of the University of Surrey; feature detection,
related image transforms and quality measures are examined separately.

The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.

· Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics
· Presents theory and it's application in a practical sense, providing long awaited solutions and new findings
· Provides a comprehensive overview of international congress proceedings and associated publications, as source material.

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About the Author:

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the university of Cambridge, whre he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals.

"About this title" may belong to another edition of this title.

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Book Description Elsevier Science Publishing Co Inc, United States, 2004. Hardback. Book Condition: New. 223 x 157 mm. Language: English . Brand New Book. The subjects reviewed in the Advances series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. Several of these topics are covered in this volume, which opens with a long chapter of monograph stature on quantitative electron microscopy at the atomic resolution level by scientists from a well-known and very distinguished Antwerp University Laboratory. This is unique in that the statistical aspects are explored fully. This is followed by a contribution by A.M. Grigoryan and S.S. Again on transform-based image enhancement, covering both frequency-ordered systems and tensor approaches. The volume concludes with an account of the problems of image registration and ways of solving them by Maria Petrou of the University of Surrey; feature detection, related image transforms and quality measures are examined separately. The text bridges the gap between academic researchers and RD designers by addressing and solving daily issues, which makes this book essential reading. Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics Presents theory and it s application in a practical sense, providing long awaited solutions and new findings Provides a comprehensive overview of international congress proceedings and associated publications, as source material. Bookseller Inventory # AA59780120147724

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Book Description Elsevier Science Publishing Co Inc, United States, 2004. Hardback. Book Condition: New. 223 x 157 mm. Language: English . Brand New Book. The subjects reviewed in the Advances series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. Several of these topics are covered in this volume, which opens with a long chapter of monograph stature on quantitative electron microscopy at the atomic resolution level by scientists from a well-known and very distinguished Antwerp University Laboratory. This is unique in that the statistical aspects are explored fully. This is followed by a contribution by A.M. Grigoryan and S.S. Again on transform-based image enhancement, covering both frequency-ordered systems and tensor approaches. The volume concludes with an account of the problems of image registration and ways of solving them by Maria Petrou of the University of Surrey; feature detection, related image transforms and quality measures are examined separately. The text bridges the gap between academic researchers and RD designers by addressing and solving daily issues, which makes this book essential reading. Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics Presents theory and it s application in a practical sense, providing long awaited solutions and new findings Provides a comprehensive overview of international congress proceedings and associated publications, as source material. Bookseller Inventory # AA59780120147724

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