Trap Level Spectroscopy in Amorphous Semiconductors - Hardcover

Mikla, Victor V.; Mikla, Victor I.

Hardcover

ISBN 10: 012384715X ISBN 13: 9780123847157

Publisher: Elsevier, 2010

Synopsis

Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most common spectroscopic techniques but also describes their advantages and disadvantages.

• Provides information on the most used spectroscopic techniques
• Discusses the advantages and disadvantages of each technique

About this title

About the Author:

Dr. Victor V. Mikla is affiliated with the Physical & Mathematical Disciplines, Department of Humanities & Natural Sciences, Uzhhgorod National University, Uzhhgorod,Ukraine

Victor I. Mikla, PhD, is Chair of Physical & Mathematical Disciplines in the Department of Humanities & Natural Sciences at Uzhhgorod National University, Uzhhorod, Ukraine. Dr. Mikla specializes in photo-electronic materials and devices, and has published research articles widely on a broad range of inter-disciplinary topics including metastable states in amorphous chalcogenides, trap level spectroscopy, medical and non-medical imaging applications of amorphous semiconductors, xerographic spectroscopy, photo-induced & structural changes, and raman scattering.

About this edition

• Publisher: Elsevier
• Publication date: 2010
• ISBN 10: 012384715X
• ISBN 13: 9780123847157
• Binding: Hardcover
• Edition number: 1
• Number of pages: 128