Advances in Imaging and Electron Physics, Volume 191

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9780128022535: Advances in Imaging and Electron Physics, Volume 191

Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy.

The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contains contributions from leading authorities on the subject matter
  • Informs and updates on all the latest developments in the field of imaging and electron physics
  • Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
  • Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science. and digital image processing

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About the Author:

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the university of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals.

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Book Description Elsevier Science Publishing Co Inc, United States, 2015. Hardback. Book Condition: New. 229 x 152 mm. Language: English . Brand New Book ***** Print on Demand *****. Advances in Imaging Electron Physics merges two long-running serials-Advances in Electronics Electron Physics and Advances in Optical Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Bookseller Inventory # APC9780128022535

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Published by Elsevier Science Publishing Co Inc, United States (2015)
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Book Description Elsevier Science Publishing Co Inc, United States, 2015. Hardback. Book Condition: New. 229 x 152 mm. Language: English . Brand New Book ***** Print on Demand *****.Advances in Imaging Electron Physics merges two long-running serials-Advances in Electronics Electron Physics and Advances in Optical Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Bookseller Inventory # APC9780128022535

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