Atomic Force Microscopy

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9780199570454: Atomic Force Microscopy
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Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique.

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About the Author:


Peter Eaton has more than ten years' experience in research using Atomic Force Microscopy. He has used a wide variety of AFM instruments in research centres and universities in the UK, France, Spain, and Portugal. He has used AFM to study pharmaceutical, chemical, materials science, nanotech and biological samples. He is the author of more than twenty research publications on AFM.

Paul West has over twenty-five years' experience with the development of atomic force microscopes. He is the co-founder of several AFM companies, the author of numerous patents, and co-author of several publications on the design and application of atomic force microscopes. He served on the United States National Nanotechnology Initiative which resulted in the first major funding of nanotechnology research.

Review:

"This book can be called a practical introduction to atomic force microscopy (AFM). It is outstanding among those written on this subject. I have worked with AFM starting from the year of its invention, and have seen books written quite formally. This book is written by true experts with a deep knowledge of the AFM technique" "This is structured as a sort of "super manual." I wish I had such a useful text when learning this technique." - Prof. Igor Sokolov, in MRS Bulletin

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9780198826286: Atomic Force Microscopy

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ISBN 10:  0198826281 ISBN 13:  9780198826286
Publisher: Oxford University Press, 2018
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Book Description Oxford University Press, United Kingdom, 2010. Hardback. Condition: New. Language: English. Brand new Book. Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easyto understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data.Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique. Seller Inventory # BTE9780199570454

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