Advances in X-Ray Analysis, Vol. 35

ISBN 13: 9780306442490

Advances in X-Ray Analysis, Vol. 35

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9780306442490: Advances in X-Ray Analysis, Vol. 35

The proceedings of the combined First Pacific-International Congress on X-Ray Analytical Methods (PICXAM) and Fortieth Annual Conference on Applications of X-Ray Analysis, held in Hilo and Honolulu Hawaii, August 1991, comprise reports on the latest developments in international research on X-ray fl

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C.S. Barrett (Editor), John V. Gilfrich (Editor), Ting C. Huang (Editor), Ron Jenkins (Editor), G.J. McCarthy (Editor), Paul K. Predecki (Editor), R. Ryon (Editor), Deane K. Smith (Editor)
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