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Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, January 1 to March 31, 1969 (Classic Reprint) - Hardcover
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Excerpt from Methods of Measurement for Semiconductor Materials, Process Control, and Devices<br/><br/>In the first report of this series [5] background information was given for the Program and for 15 of the tasks. In the second report [6] background information was included for three additional tasks. During this quarter work was begun on a single new task on gold-doped Silicon, which had been identified during the April, 1968, program review.
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices Quarterly Report, January 1 to March 31, 1969 Classic Reprint
Seller: PBShop.store US, Wood Dale, IL, U.S.A.
Seller rating 5 out of 5 stars
HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9780364995143
Quantity: 15 available
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices Quarterly Report, January 1 to March 31, 1969 Classic Reprint
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9780364995143
Quantity: 15 available