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Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, January 1 to March 30, 1972 (Classic Reprint) - Hardcover
Synopsis
This book delves into the field of methods of measurement for semiconductor materials, process control, and devices. It encompasses a wide range of topics, including resistivity, gold-doped silicon, infrared methods, die attachment evaluation, thermal properties of devices, microwave device measurements, and carrier transport in junction devices. The author, an expert in the field, provides a comprehensive overview of the current state of the art in these areas. The book is highly technical and assumes a strong background in semiconductor physics and measurement techniques. It is primarily intended for researchers, engineers, and scientists working in the semiconductor industry or in related fields. The insights presented in this book are essential for advancing the development and manufacturing of high-quality semiconductor devices.
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices Quarterly Report, January 1 to March 30, 1972 Classic Reprint
Seller: PBShop.store US, Wood Dale, IL, U.S.A.
Seller rating 5 out of 5 stars
HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9780365302056
Quantity: 15 available
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices Quarterly Report, January 1 to March 30, 1972 Classic Reprint
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9780365302056
Quantity: 15 available