Items related to Quantitative X-Ray Diffractometry
One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. Invented in 1916, but little used at the time, the technique has seen a recent revival due to the development of extremely precise X-ray diffractometers coupled with powerful computers.
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- PublisherSpringer
- Publication date1995
- ISBN 10 0387945415
- ISBN 13 9780387945415
- BindingHardcover
- Number of pages372
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Quantitative X-Ray Diffractometry Zevin, L. S.; Kimmel, Giora and Mureinik, Inez
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Book Description Condition: Used: Good. Quantitative X-Ray Diffractometry | Zevin - Kimmel | Springer Verlag New-York Berlin, 1995, in-8° cartonnage éditeur de 372 pages. Couverture propre. Dos solide. Intérieur frais sans soulignage ou annotation. Exemplaire de bibliothèque : petit code barre en pied de 1re de couv., cotation au dos, rares et discrets petits tampons à l'intérieur de l'ouvrage. Très bon état général pour cet ouvrage. [T12]. Seller Inventory # 0106UO8NZYZ
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Quantitative X-Ray Diffractometry.
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New York, Springer New York
(1995)
ISBN 10: 0387945415
ISBN 13: 9780387945415
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Hardcover
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Book Description Hardcover. 389 S. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. Ex-library with stamp and library-signature. GOOD condition, some traces of use. 9780387945415 Sprache: Englisch Gewicht in Gramm: 550. Seller Inventory # 2341233
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