Microstructural Characterization of Materials

3.71 avg rating
( 7 ratings by Goodreads )
 
9780470027851: Microstructural Characterization of Materials

Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy.

Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at http://develop.wiley.co.uk/microstructural2e/

Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.

"synopsis" may belong to another edition of this title.

From the Back Cover:

Microstructural Characterization of Materials- 2nd Edition

David Brandon and Wayne D. Kaplan.

Israel Institute of Technology, Haifa, Israel

Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy.

The book is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition of Microstructural Characterization of Materials explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises.

The book should appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who should find the book a useful and comprehensive general reference source.

"About this title" may belong to another edition of this title.

Buy New View Book
List Price: US$ 82.00
US$ 48.82

Convert Currency

Shipping: US$ 4.24
From India to U.S.A.

Destination, Rates & Speeds

Add to Basket

Top Search Results from the AbeBooks Marketplace

1.

Brandon
ISBN 10: 0470027851 ISBN 13: 9780470027851
New Softcover Quantity Available: 3
Seller
bookscollection
(Delhi, DELHI, India)
Rating
[?]

Book Description Book Condition: Brand New. U.S.Edition ,Brand New,PAPERBACK,Perfect Condition. Printed in English. excellent Quality, and customer satisfaction guaranteed.NO CD ROM & NO ACCESS We Do not Ship APO FPO AND PO BOX. Bookseller Inventory # ABEKHST108

More Information About This Seller | Ask Bookseller a Question

Buy New
US$ 48.82
Convert Currency

Add to Basket

Shipping: US$ 4.24
From India to U.S.A.
Destination, Rates & Speeds

2.

David G. Brandon, Wayne D. Kaplan
Published by John Wiley and Sons Ltd, United States (2008)
ISBN 10: 0470027851 ISBN 13: 9780470027851
New Paperback Quantity Available: 10
Seller
The Book Depository US
(London, United Kingdom)
Rating
[?]

Book Description John Wiley and Sons Ltd, United States, 2008. Paperback. Book Condition: New. 2nd Revised edition. Language: English . Brand New Book. Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source. Bookseller Inventory # AAH9780470027851

More Information About This Seller | Ask Bookseller a Question

Buy New
US$ 55.26
Convert Currency

Add to Basket

Shipping: FREE
From United Kingdom to U.S.A.
Destination, Rates & Speeds

3.

David Brandon, Wayne D. Kaplan
Published by Wiley 2008-03-14, Chichester (2008)
ISBN 10: 0470027851 ISBN 13: 9780470027851
New paperback Quantity Available: 10
Seller
Blackwell's
(Oxford, OX, United Kingdom)
Rating
[?]

Book Description Wiley 2008-03-14, Chichester, 2008. paperback. Book Condition: New. Bookseller Inventory # 9780470027851

More Information About This Seller | Ask Bookseller a Question

Buy New
US$ 52.17
Convert Currency

Add to Basket

Shipping: US$ 3.87
From United Kingdom to U.S.A.
Destination, Rates & Speeds

4.

David G. Brandon, Wayne D. Kaplan
Published by John Wiley and Sons Ltd, United States (2008)
ISBN 10: 0470027851 ISBN 13: 9780470027851
New Paperback Quantity Available: 10
Seller
The Book Depository
(London, United Kingdom)
Rating
[?]

Book Description John Wiley and Sons Ltd, United States, 2008. Paperback. Book Condition: New. 2nd Revised edition. Language: English . Brand New Book. Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source. Bookseller Inventory # AAH9780470027851

More Information About This Seller | Ask Bookseller a Question

Buy New
US$ 57.02
Convert Currency

Add to Basket

Shipping: FREE
From United Kingdom to U.S.A.
Destination, Rates & Speeds

5.

David G. Brandon
Published by Wileyand#8211;Blackwell (2008)
ISBN 10: 0470027851 ISBN 13: 9780470027851
New Quantity Available: 12
Seller
Books2Anywhere
(Fairford, GLOS, United Kingdom)
Rating
[?]

Book Description Wileyand#8211;Blackwell, 2008. PAP. Book Condition: New. New Book. Shipped from UK in 4 to 14 days. Established seller since 2000. Bookseller Inventory # FW-9780470027851

More Information About This Seller | Ask Bookseller a Question

Buy New
US$ 46.78
Convert Currency

Add to Basket

Shipping: US$ 11.61
From United Kingdom to U.S.A.
Destination, Rates & Speeds

6.

David Brandon
Published by Wiley
ISBN 10: 0470027851 ISBN 13: 9780470027851
New Paperback Quantity Available: 12
Seller
THE SAINT BOOKSTORE
(Southport, United Kingdom)
Rating
[?]

Book Description Wiley. Paperback. Book Condition: New. New copy - Usually dispatched within 2 working days. Bookseller Inventory # B9780470027851

More Information About This Seller | Ask Bookseller a Question

Buy New
US$ 55.24
Convert Currency

Add to Basket

Shipping: US$ 8.95
From United Kingdom to U.S.A.
Destination, Rates & Speeds

7.

BRANDON DAVID ET. AL
ISBN 10: 0470027851 ISBN 13: 9780470027851
New Quantity Available: 5
Seller
firstbookstore
(New Delhi, India)
Rating
[?]

Book Description Book Condition: Brand New. Brand New Original US Edition, Perfect Condition. Printed in English. Excellent Quality, Service and customer satisfaction guaranteed!. Bookseller Inventory # AIND-34671

More Information About This Seller | Ask Bookseller a Question

Buy New
US$ 64.75
Convert Currency

Add to Basket

Shipping: FREE
From India to U.S.A.
Destination, Rates & Speeds

8.

Brandon
ISBN 10: 0470027851 ISBN 13: 9780470027851
New Quantity Available: 1
Seller
Bookshub
(Karol Bagh, India)
Rating
[?]

Book Description Book Condition: New. New. US edition. Perfect condition. Customer satisfaction our priority. Bookseller Inventory # ABE-FEB-43695

More Information About This Seller | Ask Bookseller a Question

Buy New
US$ 65.47
Convert Currency

Add to Basket

Shipping: FREE
From India to U.S.A.
Destination, Rates & Speeds

9.

Brandon
ISBN 10: 0470027851 ISBN 13: 9780470027851
New Quantity Available: 1
Seller
EBOOKSTORE2010
(New Delhi, ND, India)
Rating
[?]

Book Description Book Condition: Brand New. New. US edition. Customer Satisfaction guaranteed!!. Bookseller Inventory # SHUB43695

More Information About This Seller | Ask Bookseller a Question

Buy New
US$ 65.52
Convert Currency

Add to Basket

Shipping: FREE
From India to U.S.A.
Destination, Rates & Speeds

10.

BRANDON DAVID ET. AL
ISBN 10: 0470027851 ISBN 13: 9780470027851
New Quantity Available: 5
Seller
Romtrade Corp.
(STERLING HEIGHTS, MI, U.S.A.)
Rating
[?]

Book Description Book Condition: New. Brand New Original US Edition.We Ship to PO BOX Address also. EXPEDITED shipping option also available for faster delivery. Bookseller Inventory # AUSBNEW-34671

More Information About This Seller | Ask Bookseller a Question

Buy New
US$ 68.62
Convert Currency

Add to Basket

Shipping: FREE
Within U.S.A.
Destination, Rates & Speeds

There are more copies of this book

View all search results for this book