Practical System Reliability

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9780470408605: Practical System Reliability
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Learn how to model, predict, and manage system reliability/availability throughout the development life cycle

Written by a panel of authors with a wealth of industry experience, the methods and concepts presented here give readers a solid understanding of modeling and managing system and software availability and reliability through the development of real applications and products. The modeling and prediction techniques and tools are customer-focused and data-driven, and are also aligned with industry standards (Telcordia, TL 9000, ISO, etc.). Readers will get a clear understanding about what real-world reliability and availability mean through step-by-step discussions of:

  • System availability
  • Conceptual model of reliability and availability
  • Why availability varies between customers
  • Modeling availability
  • Estimating parameters and availability from field data
  • Estimating input parameters from laboratory data
  • Estimating input parameters in the architecture/design stage
  • Prediction accuracy
  • Connecting the dots

This book can be used by system architects, engineers, and developers to better understand and manage the reliability/availability of their products; quality engineers to grasp how software and hardware quality relate to system availability; and engineering students as part of a short course on system availability and software reliability.

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From the Inside Flap:

Practical System Reliability

Learn how to model, predict, and manage system reliability/availability throughout the development life cycle

Written by a panel of authors with a wealth of industry experience, the methods and concepts presented here give readers a solid understanding of modeling and managing system and software availability and reliability through the development of real applications and products. The modeling and prediction techniques and tools are customer-focused and data-driven, and are also aligned with industry standards (Telcordia, TL 9000, ISO, etc.). Readers will get a clear understanding about what real-world reliability and availability mean through step-by-step discussions of:

  • System availability
  • Conceptual model of reliability and availability
  • Why availability varies between customers
  • Modeling availability
  • Estimating parameters and availability from field data
  • Estimating input parameters from laboratory data
  • Estimating input parameters in the architecture/design stage
  • Prediction accuracy
  • Connecting the dots

This book can be used by system architects, engineers, and developers to better understand and manage the reliability/availability of their products; quality engineers to grasp how software and hardware quality relate to system availability; and engineering students as part of a short course on system availability and software reliability.

About the Author:

Eric Bauer is a manager of reliability engineering in Alcatel-Lucent's wireline business in Murray Hill, New Jersey. He has designed, modeled, and analyzed reliability for many different products and solutions, and architected and developed software for a variety of communications devices, platforms, and products.

Xuemei Zhang, PhD, is a principal member of the technical staff in the Network Design and Performance Analysis Department at AT&T Labs. She has been working on reliability and performance analysis of wireline and wireless communications systems and networks. Her major work and research areas are in system and architectural reliability and performance, product and solution reliability and performance modeling, and software reliability.

Douglas A. Kimber retired from Alcatel-Lucent as a staff reliability engineer. Throughout his career at Bell Labs, Lucent Technologies, and Alcatel-Lucent, he developed high reliability hardware and software platforms, applications, and systems, and then transitioned to reliability engineering where he did reliability modeling and analysis.

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Bauer, Eric; Zhang, Xuemei; Kimber, Douglas A.
Published by Wiley-IEEE Press
ISBN 10: 047040860X ISBN 13: 9780470408605
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