Statistical Regression with Measurement Error: Kendall's Library of Statistics 6 - Hardcover

Cheng, Chi-Lun; Van Ness, John W.

Hardcover

ISBN 10: 047071106X ISBN 13: 9780470711064

Publisher: Wiley, 2010

Synopsis

Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the of the Kendall and Stuart Advanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. The goal is to emphasize the ideas and practical implications of the theory in a style that does not concentrate on the theorem-proof format.

About this title

About the Author

Chi-Lun Cheng and John W. Van Ness are the authors of Statistical Regression with Measurement Error: Kendall's Library of Statistics 6, published by Wiley.

Review

"Overall, the presentation is inviting and the reader can expect to gain a good working knowledge of the subject without much tedious effort. The presentation is also kept simple by avoiding the useof tedious mathematical notation. The authors have succeeded well in their goal of "providing a comprehensive coverage of the subject that emphasizes the ideas and the practical implementation of the theory without too great an emphasis on the theorem-proof format." This book is on the top of my list for anyone interested in linear and polynomial measurement error models." -- Sudhir Gupta, Technometrics, Nov 2000, Vol 42, No 4

Edition details

• Publisher: Wiley
• Publication date: 2010
• ISBN 10: 047071106X
• ISBN 13: 9780470711064
• Binding: Hardcover
• Language: English
• Edition number: 1
• Number of pages: 282