This book will appeal to practising engineers and technicians working in the areas of RF, microwaves, communications, solid-state devices and radar. Senior students, researchers in microwave engineering and microelectronics and material scientists will also find this book a very useful reference.
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L. F. Chen is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley.
C. K. Ong is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley.
C. P. Neo is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley.
V. V. Varadan is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley.
Vijay K. Varadan is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley.
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Book Description Condition: New. The development of high speed, high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This comprehensive reference sets out to address this requirement by providing guidance on the de. Seller Inventory # 556558437
Book Description Condition: New. Microwave materials are used in applications ranging from personal communication devices to military satellite services. The increasing requirement for the development of high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This book discusses about microwave electronics. Num Pages: 552 pages, Illustrations. BIC Classification: TJFN. Category: (P) Professional & Vocational. Dimension: 253 x 193 x 35. Weight in Grams: 1196. . 2004. 1st Edition. Hardcover. . . . . Seller Inventory # V9780470844922
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Book Description Hardcover. Condition: Brand New. 1st edition. 552 pages. 9.75x7.50x1.25 inches. In Stock. Seller Inventory # __0470844922
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