Other titles for the analytical chemist... Tandem Mass Spectrometry Edited by F. W. McLafferty Experts in tandem mass spectrometry bring this changing field up to date with a review of recent dramatic applications. Discusses amino acid sequencing, analysis of mixtures for trace level impurities, chemotaxonomy, and the classification of natural products. 1983 (0 471-86597-4) 506 pp. Fourier Transform Infrared Spectrometry Peter R. Griffiths and James A. de Haseth An up-to-date introduction to the theory, instrumentation and applications of FT-IR spectrometry, including new and emerging techniques. Designed to allow actual and potential users of the technique to plan their experimental procedures correctly. Easy-to-read, logical presentation makes this sophisticated subject accessible to students as well as chemists and analysts. 1986 (0 471-09902-3) 656pp. Practical Aspects of Gas Chromatography/Mass Spectrometry Gordon M. Message "...a valuable and comprehensive reference that will help scientists to obtain a greater understanding of their GC/MS systems..." —Journal of American Chemical Society A single-source reference describing how and why gas chromatography and mass spectrometry instruments work. Describes a wide rage of technologies and offers guidance for their optimum use, outlining good practice, routine procedures, and trouble shooting. 1984 (0 471-06277-4) 351 pp.
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The first major treatment of this very important and established analytical technique. A virtual handbook with state-of-the-art features surveying the basic concepts of secondary ion mass spectrometry (SIMS), and treating, in considerable detail, instrumental aspects, along with applications and future trends.From the Inside Flap:
Secondary Ion Mass Spectrometry is a major contribution to the incipient literature on SIMS, and the most thorough presentation yet of this analytical technique. Three of the field’s leading researchers join together to give a detailed and rigorous presentation of the entire subject, discussing fundamentals, instrumentation, and applications. Secondary Ion Mass Spectrometry is suitable as both an introduction and an advanced handbook. The beginner will find a rapid survey on basic concepts of SIMS, on its application, and on the many publications treating the subject. The expert will find, for the first time, a comprehensive and systematic treatment of the many details and topics of SIMS. Features include:
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Book Description Wiley-Interscience, 1987. Hardcover. Book Condition: New. Never used!. Bookseller Inventory # P110471010561