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This one volume treatise presents a comprehensive discussion of moire metrology analysis. The authors work from a new point of view, treating the gratings used in moire analysis as an artificial analog to electromagnetic waves, thereby comparing moire analysis with conventional optical methods based on wave properties such as interferometry. It is shown that for every interferometric technique in metrology, there is an analogous technique in moire metrology and vice versa, and that scientists involved in optical metrology have a real choice between interferometric and moire methods.
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The moiré effect exhibits a fringe pattern formed by the superposition of two grid structures of similar period. The first proposal to use the moiré effect for scientific purposes arose over 100 years ago, when Lord Rayleigh suggested using it for grating analysis. But only since J. Guild’s book appeared in 1956 has the moiré effect come under close study. In fact, to date, about 1,000 papers on the moiré effect have appeared. The present book is the first on the physics of the moiré effect. The authors put all the steps of the past 100 years together, for the first time, as one coherent piece, in order to establish moiré technology as a chapter in the optics section of physics. They adopt a new point of view, treating the gratings used in moiré analysis as an artificial analog to electromagnetic waves. In this way, moiré analysis may be compared with conventional optical methods based on wave properties (i.e., interferometry). And it is shown that for every interferometric technique in metrology, there is an analogous one in moiré technology, and vice versa. Moiré deflectrometry is a relatively new method of optical metrology, complementary to the common interferometry technique of optical measurement—but the moiré method is simpler and cheaper. The Physics of Moiré Metrology explains the basis of this new metrological approach in straightforward language, and summarizes all the important moiré techniques. Included is a summary of the applications of moiré interferometry and moiré deflectrometry to strain analysis. In addition, the book gives a complete analogy between interferometry, holographic interferometry, and moiré techniques, from the mapping of diffusive objects to the analysis of phase objects and reflective surfaces. Over thirty metrological problems, on all types of objects that can be solved by moiré techniques, are explained and demonstrated. There is also a survey of metrology studies carried out over the past ten years by the authors and their colleagues. The Physics of Moiré Metrology should be of interest to physicists and engineers using optical metrology, and graduate and advanced undergraduate students of science and engineering.About the Author:
About the authors Oded Kafri received his DSc in physics from the Technion, Israel Institute of Technology, Haifa, in 1973. He has worked at the Hebrew University, the University of Wisconsin-Madison, and at Allied Signal Corp., in New Jersey. In 1976, he joined the Nuclear Research Center-Negev, where he started a research group in optical metrology. In 1986, he founded Rotlex Optics Ltd. and served as president until 1989. Dr. Kafri is now President of Prior Optics, in New Jersey. He is the author or coauthor of over a hundred technical papers, has earned several awards, and holds numerous patents. Ilana Glatt received a PhD in chemistry from the Weizmann Institute of Science, Rehovot, Israel, in 1978. She joined the Nuclear Research Center-Negev in 1978, and worked in the optical metrology laboratory. In 1985, she was a visiting scientist at AT&T Bell Laboratories, and joined Rotlex Optics as manager of the optical laboratory. Dr. Glatt is the author or coauthor of dozens of technical articles, and holds several patents.
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Book Description Wiley-Interscience, 1990. Condition: New. book. Seller Inventory # MB010WFACKU