A team of internationally renowned experts contribute articles which emphasize the reliability and quality issues inherent in all phases of systems design. Coverage includes fundamental failure modes of each of the device building blocks, packaged MMIC modules, current practical aspects of reliability testing and much more.
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Book Description Wiley, 1992. Hardcover. Book Condition: New. New. book. Bookseller Inventory # F5S6-5-Z-0471934909-6
Book Description John Wiley & Sons, 1992. Hardcover. Book Condition: New. 1. Bookseller Inventory # DADAX0471934909