Secondary Ion Mass Spectrometry SIMS XI

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9780471978268: Secondary Ion Mass Spectrometry SIMS XI
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This volume contains 252 contributions presented as plenary,invited and contributed poster and oral presentations at the 11thInternational Conference on Secondary Ion Mass Spectrometry (SIMSXI) held at the Hilton Hotel, Walt Disney World Village, Orlando,Florida, 7 12 September, 1997. The book covers a diverse range ofresearch, reflecting the rapid growth in advanced semiconductorcharacterization, ultra shallow depth profiling, TOF-SIMS and thenew areas in which SIMS techniques are being used, for example inbiological sciences and organic surface characterization. Papersare presented under the following categories:
* Isotopic SIMS
* Biological SIMS
* Semiconductor Characterization Techniques and Applications
* Ultra Shallow Depth Profiling
* Depth Profiling Fundamental/Modelling and Diffusion
* Sputter-Induced Topography
* Fundamentals of Molecular Desorption
* Organic Materials
* Practical TOF-SIMS
* Polyatomic Primary Ions
* Materials/Surface Analysis
* Postionization
* Instrumentation
* Geological SIMS
* Imaging
* Fundamentals of Sputtering
* Ion Formation and Cluster Formation
* Quantitative Analysis Environmental/ParticleCharacterization
* Related Techniques
These proceedings provide an invaluable source of reference forboth newcomers to the field and experienced SIMS users.

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G. Gillen and R. Lareau are the authors of Secondary Ion Mass Spectrometry SIMS XI, published by Wiley.

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Gillen, Edited By: G.
Published by John Wiley & Sons Inc, United States (1998)
ISBN 10: 0471978264 ISBN 13: 9780471978268
New Hardcover Quantity Available: 1
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Book Description John Wiley & Sons Inc, United States, 1998. Hardback. Condition: New. Language: English. Brand new Book. This volume contains 252 contributions presented as plenary, invited and contributed poster and oral presentations at the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS XI) held at the Hilton Hotel, Walt Disney World Village, Orlando, Florida, 7 12 September, 1997. The book covers a diverse range of research, reflecting the rapid growth in advanced semiconductor characterization, ultra shallow depth profiling, TOF--SIMS and the new areas in which SIMS techniques are being used, for example in biological sciences and organic surface characterization.Papers are presented under the following categories: aeo Isotopic SIMS aeo Biological SIMS aeo Semiconductor Characterization Techniques and Applications aeo Ultra Shallow Depth Profiling aeo Depth Profiling Fundamental/Modelling and Diffusion aeo Sputter--Induced Topography aeo Fundamentals of Molecular Desorption aeo Organic Materials aeo Practical TOF--SIMS aeo Polyatomic Primary Ions aeo Materials/Surface Analysis aeo Postionization aeo Instrumentation aeo Geological SIMS aeo Imaging aeo Fundamentals of Sputtering aeo Ion Formation and Cluster Formation aeo Quantitative Analysis Environmental/Particle Characterization aeo Related Techniques These proceedings provide an invaluable source of reference for both newcomers to the field and experienced SIMS users. Seller Inventory # AAH9780471978268

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Gillen, Edited By: G.
Published by John Wiley & Sons Inc, United States (1998)
ISBN 10: 0471978264 ISBN 13: 9780471978268
New Hardcover Quantity Available: 1
Seller:
Book Depository International
(London, United Kingdom)

Book Description John Wiley & Sons Inc, United States, 1998. Hardback. Condition: New. Language: English. Brand new Book. This volume contains 252 contributions presented as plenary, invited and contributed poster and oral presentations at the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS XI) held at the Hilton Hotel, Walt Disney World Village, Orlando, Florida, 7 12 September, 1997. The book covers a diverse range of research, reflecting the rapid growth in advanced semiconductor characterization, ultra shallow depth profiling, TOF--SIMS and the new areas in which SIMS techniques are being used, for example in biological sciences and organic surface characterization.Papers are presented under the following categories: aeo Isotopic SIMS aeo Biological SIMS aeo Semiconductor Characterization Techniques and Applications aeo Ultra Shallow Depth Profiling aeo Depth Profiling Fundamental/Modelling and Diffusion aeo Sputter--Induced Topography aeo Fundamentals of Molecular Desorption aeo Organic Materials aeo Practical TOF--SIMS aeo Polyatomic Primary Ions aeo Materials/Surface Analysis aeo Postionization aeo Instrumentation aeo Geological SIMS aeo Imaging aeo Fundamentals of Sputtering aeo Ion Formation and Cluster Formation aeo Quantitative Analysis Environmental/Particle Characterization aeo Related Techniques These proceedings provide an invaluable source of reference for both newcomers to the field and experienced SIMS users. Seller Inventory # AAH9780471978268

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Gillen, G.
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ISBN 10: 0471978264 ISBN 13: 9780471978268
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G. Gillen, R. Lareau, F. Stevie, J. Bennett
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ISBN 10: 0471978264 ISBN 13: 9780471978268
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Gillen, G. (Editor)/ Lareau, R./ Bennett, J./ Stevie, F. A.
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Edited by: G. Gillen, G. Gillen (Editor), R. Lareau (Editor), J. Bennett (Editor), F. Stevie (Editor)
Published by Wiley (1998)
ISBN 10: 0471978264 ISBN 13: 9780471978268
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