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Digital Systems Testing and Testable Design (Electrical Engineering, Communications, and Signal Processin) - Hardcover
Synopsis
Modeling, logic simulation, fault modeling, fault simulation, testing for single stuck faults, testing for bridging faults, functioning testing, design for test ability, compression techniques, built-in self test, logic-level diagnosis, self-checking design, PLA testing, system-level diagnosis.
"synopsis" may belong to another edition of this title.
From the Back Cover
This widely-used textbook provides comprehensive, state-of-the-art coverage of digital systems testing and testable design.
Considered a definitive text in this area, the book includes in-depth discussions of the following topics:
Test generation
Fault modeling for classic and new technologies
Simulation
Fault simulation
Design for testability
Built-in self-test Diagnosis
All topics are covered extensively, from fundamental concepts to advanced techniques.
Successfully used world-wide at leading universities, the book is appropriate for graduate-level and senior-level undergraduate courses. Numerous examples and problems help make the learning process easier for the reader. Test engineers, ASIC and system designers, and CAD developers will find it an invaluable tool to keep current with recent changes in the field.
About the Author
Miron Abramovici is a Distinguished Member of the Technical Staff at AT&T Bell Laboratories in Murray Hill, and an Adjunct Professor of Computer Engineering at the Illinois Institute of Technology in Chicago.
Melvin A. Breuer is a Professor of Electrical Engineering and Computer Science at the University of Southern California in Los Angeles.
Arthur D. Friedman is a Professor in the Department of Electrical Engineering and Computer Science at George Washington University.
All three authors are Fellows of the IEEE and have contributed extensively to the fields discussed in this book.
"About this title" may belong to another edition of this title.
- PublisherW.H. Freeman & Company
- Publication date1990
- ISBN 10 0716781794
- ISBN 13 9780716781790
- BindingHardcover
- LanguageEnglish
- Number of pages653
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Digital Systems Testing and Testable Design (Electrical Engineering, Communications, and Signal Processin)
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Digital Systems Testing and Testable Design
Published by
Computer Science Press, 1990
ISBN 10: 0716781794
ISBN 13: 9780716781790
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First Edition
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