In an area of ever increasing interest, this volume comprises the invited papers from well known and respected workers in the field. It covers the characterization of thin films using a variety of techniques including scanning electron microscopy, scanning tunnelling microscopy, transmission electron microscopy, x-ray diffraction and electron probe microanalysis.
The main applications of this specialized field in sensors, hard coatings and microelectronics are discussed.
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Hard Cover. Condition: New. New condition. 314pp. Illustrated. Proceedings of the International Summer School May 27-June 5 1991, Czechoslovakia. Papers presented include the characterization of thin films using techniques such as scanning tunnelling microscopy, x-ray microanalysis, transmission electron microscopy, applications of thin films in coatings and sensors, industrial film thickness measurements and methods, SIMS of thin films, Fourier transform of lattices, structural surface measurements by backscattered electrons, EELS, and more. Seller Inventory # S12-000904
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