Characterisation of Radiation Damage by Transmission Electron Microscopy (Series in Microscopy in Materials Science)

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9780750307482: Characterisation of Radiation Damage by Transmission Electron Microscopy (Series in Microscopy in Materials Science)

Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clusters, such as dislocation loops, because the coverage in general microscopy textbooks is limited and omits many of the problems associated with the analysis of these defects. The book also describes in situ, high-resolution, and analytical techniques. Techniques are illustrated with examples, providing a solid overview of the contribution of TEM to radiation damage mechanisms. The book is most useful to researchers in, or entering into, the field of defect analysis in materials.

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M. L. Jenkins, M. a. Kirk
Published by Taylor Francis Ltd, United Kingdom (2000)
ISBN 10: 075030748X ISBN 13: 9780750307482
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Book Description Taylor Francis Ltd, United Kingdom, 2000. Hardback. Book Condition: New. Language: English . Brand New Book. Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clusters, such as dislocation loops, because the coverage in general microscopy textbooks is limited and omits many of the problems associated with the analysis of these defects. The book also describes in situ, high-resolution, and analytical techniques. Techniques are illustrated with examples, providing a solid overview of the contribution of TEM to radiation damage mechanisms. The book is most useful to researchers in, or entering into, the field of defect analysis in materials. Bookseller Inventory # AA69780750307482

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M. L. Jenkins, M. a. Kirk
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Book Description Taylor Francis Ltd, United Kingdom, 2000. Hardback. Book Condition: New. Language: English . Brand New Book. Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clusters, such as dislocation loops, because the coverage in general microscopy textbooks is limited and omits many of the problems associated with the analysis of these defects. The book also describes in situ, high-resolution, and analytical techniques. Techniques are illustrated with examples, providing a solid overview of the contribution of TEM to radiation damage mechanisms. The book is most useful to researchers in, or entering into, the field of defect analysis in materials. Bookseller Inventory # AA69780750307482

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Jenkins, M. L.
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Book Description Taylor & Francis Ltd. Hardback. Book Condition: new. BRAND NEW, Characterisation of Radiation Damage by Transmission Electron Microscopy, M. L. Jenkins, M. A. Kirk, Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clusters, such as dislocation loops, because the coverage in general microscopy textbooks is limited and omits many of the problems associated with the analysis of these defects. The book also describes in situ, high-resolution, and analytical techniques. Techniques are illustrated with examples, providing a solid overview of the contribution of TEM to radiation damage mechanisms. The book is most useful to researchers in, or entering into, the field of defect analysis in materials. Bookseller Inventory # B9780750307482

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JENKINS, M.L; KIRK, M.A.
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Book Description Taylor & Francis, 2000. Hardback. Book Condition: NEW. 9780750307482 This listing is a new book, a title currently in-print which we order directly and immediately from the publisher. Bookseller Inventory # HTANDREE0185669

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M. L. Jenkins, M. a. Kirk
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Book Description Taylor Francis Ltd, United Kingdom, 2000. Hardback. Book Condition: New. Language: English . This book usually ship within 10-15 business days and we will endeavor to dispatch orders quicker than this where possible. Brand New Book. Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clusters, such as dislocation loops, because the coverage in general microscopy textbooks is limited and omits many of the problems associated with the analysis of these defects. The book also describes in situ, high-resolution, and analytical techniques. Techniques are illustrated with examples, providing a solid overview of the contribution of TEM to radiation damage mechanisms. The book is most useful to researchers in, or entering into, the field of defect analysis in materials. Bookseller Inventory # BTE9780750307482

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Book Description Taylor & Francis, 2000. Hardcover. Book Condition: New. 1. Bookseller Inventory # DADAX075030748X

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