Defect and Fault Tolerance in Vlsi Systems (Dft 2000): 2000 IEEE International Symposium - Softcover
Synopsis
This volume includes 45 papers presented at the October 2000 symposium, covering yield analysis, modeling, and enhancement; fault tolerance interconnections and systems; reconfiguration and repair; error coding; online testing; testing and BIST techniques; and fault injection techniques and environments. The authors, professionals and academics from 18 different companies, offer papers on specific topics such as quality-effective repair of multichip module systems, evaluations of burst error recovery for VF arithmetic coding, and test cost minimization for Hybrid BIST. A thorough subject index is lacking. Annotation c. Book News, Inc., Portland, OR (booknews.com)
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2000 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems (Dft 2000)
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Soft cover. Condition: As New. I.E.E.E.Press/ Computer Society 2000 paperback 422 pages full of statistics, minor shelfwear but this is A BRAND NEW BOOK UNUSED. Full refund if not satisfied. 24 hour despatch via Insured for. If not pictured in this listing, a scan of the actual book is available on request. Seller Inventory # tla2862a
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