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Defect Oriented Testing for CMOS Analog and Digital Circuits (Frontiers in Electronic Testing) - Hardcover
Synopsis
Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that can not be modeled by traditional fault modeling approaches. Furthermore, with increased level of integration, an IC may contain diverse building blocks. Such blocks include, digital logic, PLAs, volatile and non-volatile memories, and analog interfaces. For such diverse building blocks,...
- PublisherSpringer
- Publication date1997
- ISBN 10 0792380835
- ISBN 13 9780792380832
- BindingHardcover
- LanguageEnglish
- Edition number1
- Number of pages324
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Defect Oriented Testing for CMOS Analog and Digital Circuits (Frontiers in Electronic Testing)
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Defect Oriented Testing for CMOS Analog and Digital Circuits
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Defect Oriented Testing for CMOS Analog and Digital Circuits (Frontiers in Electronic Testing)
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Defect Oriented Testing for CMOS Analog and Digital Circuits (Frontiers in Electronic Testing)
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