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This book provides solutions to the challenges involved in fringe pattern analysis, covering techniques for full-field, noncontact, and high-sensitivity measurement. The primary goal of fringe pattern analysis is to extract the hidden phase distributions that generally relate to the physical quantities being measured. Both theoretical analysis and algorithm development are covered to facilitate the work of researchers and engineers. The information presented is also appropriate as a specialized subject for students of optical and computer engineering.
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Book Description SPIE Press, 2013. Condition: New. book. Seller Inventory # M0819496413
Book Description SPIE Press, 2013. Condition: New. book. Seller Inventory # MB010WF8A2C
Book Description Society of Photo Optical, 2013. Paperback. Condition: Brand New. 278 pages. 10.25x7.25x0.75 inches. In Stock. Seller Inventory # zk0819496413
Book Description SPIE Press, 2013. Paperback. Condition: New. Ships with Tracking Number! INTERNATIONAL WORLDWIDE Shipping available. Buy with confidence, excellent customer service!. Seller Inventory # 0819496413n