Quantitative X-Ray Spectrometry, Second Edition, (Practical Spectroscopy)

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9780824795542: Quantitative X-Ray Spectrometry, Second Edition, (Practical Spectroscopy)
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This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.

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"International praise for the previous edition. . . . . .critically describes x-ray instrumentation and techniques. . .has one of the most extensive discussions of energy-dispersive x-ray spectrometry of any book." ---Analytical Chemistry ." . .a valuable compendium for the practicing x-ray spectroscopist in industry and science or researchers in other fields who have to apply x-ray analysis." ---Journal of Applied Crystallography "Ron Jenkins could. . .be described as the doyen of XRF and together with his colleagues R. W. Gould and Dale Gedcke brings vast wealth of experience to the subject of XRF. . .. . . .the main revisions to this second edition are the inclusion of details of layered synthetic microstructures, total reflection X-ray spectrometry, and the influence of the personal computer. . ..an important contribution to XRF and will be of interest to both new and established workers in this field." ---Journal of Analytical Atomic Spectrometry

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Jenkins, Ron
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Book Description Taylor Francis Inc, United States, 1995. Hardback. Condition: New. 2nd Revised edition. Language: English . This book usually ship within 10-15 business days and we will endeavor to dispatch orders quicker than this where possible. Brand New Book. This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines. Seller Inventory # BTE9780824795542

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Book Description Marcel Dekker Inc, 1995. Hardcover. Condition: Brand New. 2nd sub edition. 484 pages. 9.50x6.50x1.00 inches. In Stock. Seller Inventory # __0824795547

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Book Description CRC Press, 2018. Hardback. Condition: NEW. 9780824795542 This listing is a new book, a title currently in-print which we order directly and immediately from the publisher. Print on Demand title, produced to the highest standard, and there would be a delay in dispatch of around 10 working days. For all enquiries, please contact Herb Tandree Philosophy Books directly - customer service is our primary goal. Seller Inventory # HTANDREE0250838

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