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Microelectronic Reliability, Vol. 2: Integrity Assessment and Assurance (Artech House Materials Science Library) (English and Italian Edition) - Hardcover
Synopsis
A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi
"synopsis" may belong to another edition of this title.
About the Author
Pollino received a degree in physics from the University of Torino. Since 1980 he has been in charge of the reliability section of the technological division of CSELT. He teaches Electronic Technologies as associate professor.
"About this title" may belong to another edition of this title.
- PublisherArtech House Publishers
- Publication date1989
- ISBN 10 0890063508
- ISBN 13 9780890063507
- BindingHardcover
- LanguageEnglish
- Number of pages556
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Microelectronic Reliability: Integrity Assessment and Assurance
Published by
Artech House Publishers, 1989
ISBN 10: 0890063508
ISBN 13: 9780890063507
Used
Hardcover
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Hardcover. Condition: Très bon. Ancien livre de bibliothèque. Légères traces d'usure sur la couverture. Edition 1989. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Very good. Former library book. Slight signs of wear on the cover. Edition 1989. Ammareal gives back up to 15% of this item's net price to charity organizations. Seller Inventory # D-706-850
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Microelectronic Reliability, Vol. 2: Integrity Assessment and Assurance (Artech House Materials Science Library) (English and Italian Edition)
Published by
Artech House Publishers, 1989
ISBN 10: 0890063508
ISBN 13: 9780890063507
Used
Hardcover
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hardcover. Condition: Very Good. Initials on bottom, otherwise clean and tight. Seller Inventory # mon0000699127
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Microelectronic Reliability, Vol. 2: Integrity Assessment and Assurance (Artech House Materials Science Library)
Published by
Artech House Publishers, 1989
ISBN 10: 0890063508
ISBN 13: 9780890063507
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Microelectronic Reliability, Vol. 2: Integrity Assessment and Assurance (Artech House Materials Science Library) (English and Italian Edition)
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Microelectronic Reliability, Vol. 2: Integrity Assessment and Assurance (Artech House Materials Science Library) (English and Italian Edition)
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Microelectronic Reliability Integrity Assessment and Assurance Integrity, Assessment and Assurance v 2 Electronic Materials Devices Library
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Microelectronic Reliability, Vol. 2: Integrity Assessment and Assurance (Artech House Materials Science Library) (English and Italian Edition)
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Microelectronic Reliability: Integrity Assessment and Assurance
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Gebunden. Condition: New. KlappentextA companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importan. Seller Inventory # 898961556
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Microelectronic Reliability: Integrity Assessment and Assurance
Published by
Artech House Publishers Apr 1989, 1989
ISBN 10: 0890063508
ISBN 13: 9780890063507
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Buch. Condition: Neu. Neuware - A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi. Seller Inventory # 9780890063507
Quantity: 2 available