Items related to Fundamentals of Modern VLSI Devices
Synopsis
Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The first edition has been widely adopted as a standard textbook in microelectronics in many major US universities and worldwide. The internationally renowned authors highlight the intricate interdependencies and subtle trade-offs between various practically important device parameters, and provide an in-depth discussion of device scaling and scaling limits of CMOS and bipolar devices. Equations and parameters provided are checked continuously against the reality of silicon data, making the book equally useful in practical transistor design and in the classroom. Every chapter has been updated to include the latest developments, such as MOSFET scale length theory, high-field transport model and SiGe-base bipolar devices.
"synopsis" may belong to another edition of this title.
About the Authors
Yuan Taur is a Professor of Electrical and Computer Engineering at the University of California, San Diego. He spent twenty years at IBM's T. J. Watson Research Center where he won numerous invention and achievement awards. He is an IEEE Fellow, Editor-in-Chief of IEEE Electron Device Letters, and holds thirteen US patents.
Tak H. Ning is an IBM Fellow at the T. J. Watson Research Center, New York, where he has worked for over 35 years. A Fellow of the IEEE and the American Physical Society and a member of the US National Academy of Engineering, he has authored more than 120 technical papers and holds 36 US patents. He has won several awards, including the ECS 2007 Gordon E. Moore Medal, the IEEE 1991 Jack A. Morton Award and the 1998 Pan Wen-Yuan Foundation Outstanding Research Award.
"About this title" may belong to another edition of this title.
Other Popular Editions of the Same Title
Search results for Fundamentals of Modern VLSI Devices
International Edition
Fundamentals Of Modern Vlsi Devices, Second Edition
Published by
Cambridge University Press, 2013
ISBN 10: 1107635713
ISBN 13: 9781107635715
New
Softcover
Seller: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
Seller rating 5 out of 5 stars
Condition: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide. Seller Inventory # ABNR-2209
Quantity: 5 available
International Edition
Fundamentals Of Modern Vlsi Devices, Second Edition
Published by
Cambridge University Press, 2013
ISBN 10: 1107635713
ISBN 13: 9781107635715
New
Softcover
Seller: Basi6 International, Irving, TX, U.S.A.
Seller rating 5 out of 5 stars
Condition: Brand New. New.SoftCover International edition. Different ISBN and Cover image but contents are same as US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service. Seller Inventory # ABEJUNE24-162420
Quantity: Over 20 available
Stock Image
Fundamentals of Modern VLSI Devices
Published by
Cambridge University Press, 2013
ISBN 10: 1107635713
ISBN 13: 9781107635715
Used
Paperback
Seller: WorldofBooks, Goring-By-Sea, WS, United Kingdom
Seller rating 5 out of 5 stars
Paperback. Condition: Very Good. The book has been read, but is in excellent condition. Pages are intact and not marred by notes or highlighting. The spine remains undamaged. Seller Inventory # GOR014437636
Quantity: 1 available
Stock Image
Fundamentals of Modern VLSI Devices [Paperback] Taur, Yuan
Published by
Cambridge University Press, 2013
ISBN 10: 1107635713
ISBN 13: 9781107635715
Used
paperback
Seller: Zebra Books, Cambridge, United Kingdom
Seller rating 4 out of 5 stars
paperback. Condition: Very Good. Publishers "DAMAGED" stamp to copyright page, otherwise minimal wear. VG+. Seller Inventory # BD510
Quantity: 1 available
Stock Image
Fundamentals of Modern VLSI Devices
Published by
Cambridge University Press, 2013
ISBN 10: 1107635713
ISBN 13: 9781107635715
New
Paperback
Seller: Toscana Books, AUSTIN, TX, U.S.A.
Seller rating 5 out of 5 stars
Paperback. Condition: new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks. Seller Inventory # Scanned1107635713
Quantity: 1 available