Items related to Fundamentals of Modern VLSI Devices

Fundamentals of Modern VLSI Devices - Softcover

  • 3.91 out of 5 stars
    22 ratings by Goodreads
 
9781107635715: Fundamentals of Modern VLSI Devices

Synopsis

Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The first edition has been widely adopted as a standard textbook in microelectronics in many major US universities and worldwide. The internationally renowned authors highlight the intricate interdependencies and subtle trade-offs between various practically important device parameters, and provide an in-depth discussion of device scaling and scaling limits of CMOS and bipolar devices. Equations and parameters provided are checked continuously against the reality of silicon data, making the book equally useful in practical transistor design and in the classroom. Every chapter has been updated to include the latest developments, such as MOSFET scale length theory, high-field transport model and SiGe-base bipolar devices.

"synopsis" may belong to another edition of this title.

About the Authors

Yuan Taur is a Professor of Electrical and Computer Engineering at the University of California, San Diego. He spent twenty years at IBM's T. J. Watson Research Center where he won numerous invention and achievement awards. He is an IEEE Fellow, Editor-in-Chief of IEEE Electron Device Letters, and holds thirteen US patents.

Tak H. Ning is an IBM Fellow at the T. J. Watson Research Center, New York, where he has worked for over 35 years. A Fellow of the IEEE and the American Physical Society and a member of the US National Academy of Engineering, he has authored more than 120 technical papers and holds 36 US patents. He has won several awards, including the ECS 2007 Gordon E. Moore Medal, the IEEE 1991 Jack A. Morton Award and the 1998 Pan Wen-Yuan Foundation Outstanding Research Award.

"About this title" may belong to another edition of this title.

Buy Used

Condition: Very Good
The book has been read, but is...
View this item

US$ 7.59 shipping from United Kingdom to U.S.A.

Destination, rates & speeds

Search results for Fundamentals of Modern VLSI Devices

International Edition
International Edition

Yuan Taur & Tak H. Ning
Published by Cambridge University Press, 2013
ISBN 10: 1107635713 ISBN 13: 9781107635715
New Softcover
International Edition

Seller: Basi6 International, Irving, TX, U.S.A.

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Condition: Brand New. New.SoftCover International edition. Different ISBN and Cover image but contents are same as US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service. Seller Inventory # ABEJUNE24-162420

Contact seller

Buy New

US$ 32.34
Convert currency
Shipping: FREE
Within U.S.A.
Destination, rates & speeds

Quantity: 20 available

Add to basket

Stock Image

Taur, Yuan
Published by Cambridge University Press, 2013
ISBN 10: 1107635713 ISBN 13: 9781107635715
Used Paperback

Seller: WorldofBooks, Goring-By-Sea, WS, United Kingdom

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Paperback. Condition: Very Good. The book has been read, but is in excellent condition. Pages are intact and not marred by notes or highlighting. The spine remains undamaged. Seller Inventory # GOR014437636

Contact seller

Buy Used

US$ 30.70
Convert currency
Shipping: US$ 7.59
From United Kingdom to U.S.A.
Destination, rates & speeds

Quantity: 1 available

Add to basket

Stock Image

Taur, Yuan
Published by Cambridge University Press, 2013
ISBN 10: 1107635713 ISBN 13: 9781107635715
Used paperback

Seller: Zebra Books, Cambridge, United Kingdom

Seller rating 4 out of 5 stars 4-star rating, Learn more about seller ratings

paperback. Condition: Very Good. Publishers "DAMAGED" stamp to copyright page, otherwise minimal wear. VG+. Seller Inventory # BD510

Contact seller

Buy Used

US$ 30.70
Convert currency
Shipping: US$ 27.09
From United Kingdom to U.S.A.
Destination, rates & speeds

Quantity: 1 available

Add to basket

Stock Image

Taur, Yuan
Published by Cambridge University Press, 2013
ISBN 10: 1107635713 ISBN 13: 9781107635715
New Softcover

Seller: Toscana Books, AUSTIN, TX, U.S.A.

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Condition: new. Seller Inventory # Scanned1107635713

Contact seller

Buy New

US$ 188.15
Convert currency
Shipping: US$ 4.30
Within U.S.A.
Destination, rates & speeds

Quantity: 1 available

Add to basket