SOC (System-on-a-Chip) Testing for Plug and Play Test Automation (Frontiers in Electronic Testing, 21) - Hardcover
Synopsis
System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity.
SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing.
SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.
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SOC (System-on-a-Chip) Testing for Plug and Play Test Automation (Frontiers in Electronic Testing, 21).
Published by
Kluwer Academic., 2002
ISBN 10: 1402072058
ISBN 13: 9781402072055
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufactu. Seller Inventory # 4094910
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SOC (System-On-a-Chip) Testing for Plug and Play Test Automation
Published by
Kluwer Academic Publishers, 2002
ISBN 10: 1402072058
ISBN 13: 9781402072055
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Condition: New. System-on-a-Chip (SOC) integrated circuits composed of embedded cores are commonplace. Nevertheless, there remain several roadblocks to efficient system integration. This work contains thirteen contributions that address various aspects of SOC testing. It is suitable for researchers and students interested in various aspects of SOC testing. Series: Frontiers in Electronic Testing. Num Pages: 200 pages, biography. BIC Classification: TJFD. Category: (UU) Undergraduate. Dimension: 279 x 210 x 12. Weight in Grams: 588. . 2002. New ed. Hardback. . . . . Seller Inventory # V9781402072055