Items related to Power-Aware Testing and Test Strategies for Low Power...
Synopsis
Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.
"synopsis" may belong to another edition of this title.
From the Back Cover
Power-Aware Testing and Test Strategies for Low-Power Devices
Edited by:
Patrick Girard, Research Director, CNRS / LIRMM, France
Nicola Nicolici, Associate Professor, McMaster University, Canada
Xiaoqing Wen, Professor, Kyushu Institute of Technology, Japan
Managing the power consumption of circuits and systems is now considered as one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low-power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and Electronic Design Automation (EDA) solutions for testing low-power devices.
- The first comprehensive book on power-aware test for (low-power) circuits and systems
- Shows readers how low-power devices can be tested safely without affecting yield and reliability
- Includes necessary background information on design-for-test and low-power design
- Covers in detail power-constrained test techniques, including power-aware automatic test pattern generation, design-for-test, built-in self-test and test compression
- Presents state-of-the-art industrial practices and EDA solutions
"About this title" may belong to another edition of this title.
Buy New
View this item
US$ 152.64
US$ 15.84 shipping from Italy to U.S.A.
Destination, rates & speeds
Search results for Power-Aware Testing and Test Strategies for Low Power...
Stock Image
Power-Aware Testing and Test Strategies for Low Power Devices (eng)
Print on DemandSeller: Brook Bookstore On Demand, Napoli, NA, Italy
Seller rating 4 out of 5 stars
Condition: new. Questo è un articolo print on demand. Seller Inventory # 347175974793486095c286a85b6732cb
Quantity: Over 20 available
Stock Image
Power-Aware Testing and Test Strategies for Low Power Devices
Seller: Lucky's Textbooks, Dallas, TX, U.S.A.
Seller rating 5 out of 5 stars
Condition: New. Seller Inventory # ABLIING23Mar2411530293430
Quantity: Over 20 available
Stock Image
Power-Aware Testing and Test Strategies for Low Power Devices
Seller: Buchpark, Trebbin, Germany
Seller rating 5 out of 5 stars
Condition: Sehr gut. Zustand: Sehr gut | Seiten: 363 | Sprache: Englisch | Produktart: Bücher. Seller Inventory # 5664520/12
Quantity: 1 available
Stock Image
Power-Aware Testing and Test Strategies for Low Power Devices
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In. Seller Inventory # ria9781441909275_new
Quantity: Over 20 available
Seller Image
Power-Aware Testing and Test Strategies for Low Power Devices
Published by
SPRINGER NATURE Nov 2009, 2009
ISBN 10: 1441909273
ISBN 13: 9781441909275
New
Hardcover
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices. 363 pp. Englisch. Seller Inventory # 9781441909275
Quantity: 2 available
Seller Image
Power-Aware Testing and Test Strategies for Low Power Devices
Print on DemandSeller: moluna, Greven, Germany
Seller rating 5 out of 5 stars
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Is the only comprehensive book on power-aware test for (low power) circuits and systemsInstructs readers how low-power devices can be tested safely without affecting yield and reliabilityIncludes necessary background information on design f. Seller Inventory # 4172135
Quantity: Over 20 available
Seller Image
Power-Aware Testing and Test Strategies for Low Power Devices
Seller: AHA-BUCH GmbH, Einbeck, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices. Seller Inventory # 9781441909275
Quantity: 2 available