Fundamentals of Nanoscale Film Analysis

4.5 avg rating
( 2 ratings by Goodreads )
 
9781441939807: Fundamentals of Nanoscale Film Analysis
View all copies of this ISBN edition:
 
 

From materials science to integrated circuit development, much of modern technology is moving from the microscale toward the nanoscale. This book focuses on the fundamental physics underlying innovative techniques for analyzing surfaces and near-surfaces. New analytical techniques have emerged to meet these technological requirements, all based on a few processes that govern the interactions of particles and radiation with matter. This book addresses the fundamentals and application of these processes, from thin films to field effect transistors.

"synopsis" may belong to another edition of this title.

From the Back Cover:

Modern science and technology, from materials science to integrated circuit development, is directed toward the nanoscale. From thin films to field effect transistors, the emphasis is on reducing dimensions from the micro to the nanoscale. Fundamentals of Nanoscale Film Analysis concentrates on analysis of the structure and composition of the surface and the outer few tens to hundred nanometers in depth. It describes characterization techniques to quantify the structure, composition and depth distribution of materials with the use of energetic particles and photons.

The book describes the fundamentals of materials characterization from the standpoint of the incident photons or particles which interrogate nanoscale structures. These induced reactions lead to the emission of a variety of detected of particles and photons. It is the energy and intensity of the detected beams that is the basis of the characterization of the materials. The array of experimental techniques used in nanoscale materials analysis covers a wide range of incident particle and detected beam interactions.

Included are such important interactions as atomic collisions, Rutherford backscattering, ion channeling, diffraction, photon absorption, radiative and nonradiative transitions, and nuclear reactions. A variety of analytical and scanning probe microscopy techniques are presented in detail.

"About this title" may belong to another edition of this title.

Buy New View Book
List Price: US$ 99.99
US$ 92.46

Convert currency

Shipping: FREE
From United Kingdom to U.S.A.

Destination, rates & speeds

Add to Basket

Other Popular Editions of the Same Title

9780387292601: Fundamentals of Nanoscale Film Analysis

Featured Edition

ISBN 10:  0387292608 ISBN 13:  9780387292601
Publisher: Springer, 2007
Hardcover

Top Search Results from the AbeBooks Marketplace

1.

Terry L. Alford, L.C. Feldman, James W. Mayer
Published by Springer-Verlag New York Inc., United States (2010)
ISBN 10: 1441939806 ISBN 13: 9781441939807
New Paperback Quantity Available: 10
Seller:
Book Depository hard to find
(London, United Kingdom)
Rating
[?]

Book Description Springer-Verlag New York Inc., United States, 2010. Paperback. Condition: New. Language: English . This book usually ship within 10-15 business days and we will endeavor to dispatch orders quicker than this where possible. Brand New Book. From materials science to integrated circuit development, much of modern technology is moving from the microscale toward the nanoscale. This book focuses on the fundamental physics underlying innovative techniques for analyzing surfaces and near-surfaces. New analytical techniques have emerged to meet these technological requirements, all based on a few processes that govern the interactions of particles and radiation with matter. This book addresses the fundamentals and application of these processes, from thin films to field effect transistors. Softcover reprint of hardcover 1st ed. 2007. Seller Inventory # LIE9781441939807

More information about this seller | Contact this seller

Buy New
US$ 92.46
Convert currency

Add to Basket

Shipping: FREE
From United Kingdom to U.S.A.
Destination, rates & speeds

2.

Terry L. Alford, L.C. Feldman, James W. Mayer
Published by Springer-Verlag New York Inc., United States (2010)
ISBN 10: 1441939806 ISBN 13: 9781441939807
New Paperback Quantity Available: 10
Print on Demand
Seller:
The Book Depository
(London, United Kingdom)
Rating
[?]

Book Description Springer-Verlag New York Inc., United States, 2010. Paperback. Condition: New. Language: English . Brand New Book ***** Print on Demand *****.From materials science to integrated circuit development, much of modern technology is moving from the microscale toward the nanoscale. This book focuses on the fundamental physics underlying innovative techniques for analyzing surfaces and near-surfaces. New analytical techniques have emerged to meet these technological requirements, all based on a few processes that govern the interactions of particles and radiation with matter. This book addresses the fundamentals and application of these processes, from thin films to field effect transistors. Softcover reprint of hardcover 1st ed. 2007. Seller Inventory # AAV9781441939807

More information about this seller | Contact this seller

Buy New
US$ 93.00
Convert currency

Add to Basket

Shipping: FREE
From United Kingdom to U.S.A.
Destination, rates & speeds

3.

TERRY L. ALFORD
Published by Springer (2010)
ISBN 10: 1441939806 ISBN 13: 9781441939807
New Paperback Quantity Available: 1
Seller:
Herb Tandree Philosophy Books
(Stroud, GLOS, United Kingdom)
Rating
[?]

Book Description Springer, 2010. Paperback. Condition: NEW. 9781441939807 This listing is a new book, a title currently in-print which we order directly and immediately from the publisher. For all enquiries, please contact Herb Tandree Philosophy Books directly - customer service is our primary goal. Seller Inventory # HTANDREE0296508

More information about this seller | Contact this seller

Buy New
US$ 87.43
Convert currency

Add to Basket

Shipping: US$ 10.42
From United Kingdom to U.S.A.
Destination, rates & speeds

4.

Terry L. Alford, L.C. Feldman, James W. Mayer
Published by Springer-Verlag New York Inc., United States (2010)
ISBN 10: 1441939806 ISBN 13: 9781441939807
New Paperback Quantity Available: 10
Seller:
Book Depository International
(London, United Kingdom)
Rating
[?]

Book Description Springer-Verlag New York Inc., United States, 2010. Paperback. Condition: New. Language: English. Brand new Book. From materials science to integrated circuit development, much of modern technology is moving from the microscale toward the nanoscale. This book focuses on the fundamental physics underlying innovative techniques for analyzing surfaces and near-surfaces. New analytical techniques have emerged to meet these technological requirements, all based on a few processes that govern the interactions of particles and radiation with matter. This book addresses the fundamentals and application of these processes, from thin films to field effect transistors. Softcover reprint of hardcover 1st ed. 2007. Seller Inventory # AAV9781441939807

More information about this seller | Contact this seller

Buy New
US$ 99.34
Convert currency

Add to Basket

Shipping: FREE
From United Kingdom to U.S.A.
Destination, rates & speeds

5.

Terry L. Alford
Published by Springer-Verlag New York Inc. (2010)
ISBN 10: 1441939806 ISBN 13: 9781441939807
New Quantity Available: > 20
Print on Demand
Seller:
Pbshop
(Wood Dale, IL, U.S.A.)
Rating
[?]

Book Description Springer-Verlag New York Inc., 2010. PAP. Condition: New. New Book. Shipped from US within 10 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Seller Inventory # IQ-9781441939807

More information about this seller | Contact this seller

Buy New
US$ 104.90
Convert currency

Add to Basket

Shipping: US$ 3.99
Within U.S.A.
Destination, rates & speeds

6.

Terry L. Alford
Published by Springer-Verlag New York Inc. (2010)
ISBN 10: 1441939806 ISBN 13: 9781441939807
New Quantity Available: > 20
Print on Demand
Seller:
Books2Anywhere
(Fairford, GLOS, United Kingdom)
Rating
[?]

Book Description Springer-Verlag New York Inc., 2010. PAP. Condition: New. New Book. Delivered from our UK warehouse in 3 to 5 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Seller Inventory # LQ-9781441939807

More information about this seller | Contact this seller

Buy New
US$ 97.63
Convert currency

Add to Basket

Shipping: US$ 11.75
From United Kingdom to U.S.A.
Destination, rates & speeds

7.

Terry L. Alford; L.C. Feldman; James W. Mayer
Published by Springer (2010)
ISBN 10: 1441939806 ISBN 13: 9781441939807
New Softcover Quantity Available: 15
Print on Demand
Seller:
Rating
[?]

Book Description Springer, 2010. Condition: New. This item is printed on demand for shipment within 3 working days. Seller Inventory # LP9781441939807

More information about this seller | Contact this seller

Buy New
US$ 109.27
Convert currency

Add to Basket

Shipping: US$ 3.51
From Germany to U.S.A.
Destination, rates & speeds

8.

Terry L. Alford, L.C. Feldman, James W. Mayer
Published by Springer (2010)
ISBN 10: 1441939806 ISBN 13: 9781441939807
New Paperback Quantity Available: 1
Seller:
Ergodebooks
(RICHMOND, TX, U.S.A.)
Rating
[?]

Book Description Springer, 2010. Paperback. Condition: New. Softcover reprint of hardcover 1. Seller Inventory # DADAX1441939806

More information about this seller | Contact this seller

Buy New
US$ 109.95
Convert currency

Add to Basket

Shipping: US$ 3.99
Within U.S.A.
Destination, rates & speeds

9.

Alford, Terry L.; Feldman, L.C.; Mayer, James W.
Published by Springer (2010)
ISBN 10: 1441939806 ISBN 13: 9781441939807
New Paperback Quantity Available: 10
Seller:
Ergodebooks
(RICHMOND, TX, U.S.A.)
Rating
[?]

Book Description Springer, 2010. Paperback. Condition: New. Seller Inventory # INGM9781441939807

More information about this seller | Contact this seller

Buy New
US$ 111.54
Convert currency

Add to Basket

Shipping: US$ 3.99
Within U.S.A.
Destination, rates & speeds

10.

Terry L. Alford; L.C. Feldman; James W. Mayer
Published by Springer (2010)
ISBN 10: 1441939806 ISBN 13: 9781441939807
New Softcover Quantity Available: 1
Seller:
Irish Booksellers
(Portland, ME, U.S.A.)
Rating
[?]

Book Description Springer, 2010. Condition: New. book. Seller Inventory # M1441939806

More information about this seller | Contact this seller

Buy New
US$ 134.84
Convert currency

Add to Basket

Shipping: US$ 3.27
Within U.S.A.
Destination, rates & speeds

There are more copies of this book

View all search results for this book