Nanoscale Phenomena in Ferroelectric Thin Films (Multifunctional Thin Film Series)

0 avg rating
( 0 ratings by Goodreads )
 
9781461347712: Nanoscale Phenomena in Ferroelectric Thin Films (Multifunctional Thin Film Series)
View all copies of this ISBN edition:
 
 

This book presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films. It comprises two main parts, i.e. electrical characterization in nanoscale ferroelectric capacitor, and nano domain manipulation and visualization in ferroelectric materials. Well­ known le'adingexperts both in relevant academia and industry over the world (U.S., Japan, Germany, Switzerland, Korea) were invited to contribute to each chapter. The first part under the title of electrical characterization in nanoscale ferroelectric capacitors starts with Chapter 1, "Testing and characterization of ferroelectric thin film capacitors," written by Dr. I. K. Yoo. The author provides a comprehensive review on basic concepts and terminologies of ferroelectric properties and their testing methods. This chapter also covers reliability issues in FeRAMs that are crucial for commercialization of high­ density memory products. In Chapter 2, "Size effects in ferroelectric film capacitors: role ofthe film thickness and capacitor size," Dr. I. Stolichnov discusses the size effects both in in-plane and out-of-plane dimensions of the ferroelectric thin film. The author successfully relates the electric performance and domain dynamics with proposed models of charge injection and stress induced phase transition. The author's findings present both a challenging problem and the clue to its solution of reliably predicting the switching properties for ultra-thin ferroelectric capacitors. In Chapter 3, "Ferroelectric thin films for memory applications: nanoscale characterization by scanning force microscopy," Prof. A.

"synopsis" may belong to another edition of this title.

Buy New View Book
List Price: US$ 199.99
US$ 199.31

Convert currency

Shipping: FREE
From United Kingdom to U.S.A.

Destination, rates & speeds

Add to Basket

Other Popular Editions of the Same Title

9781402076305: Nanoscale Phenomena in Ferroelectric Thin Films (Multifunctional Thin Film Series)

Featured Edition

ISBN 10:  1402076304 ISBN 13:  9781402076305
Publisher: Springer, 2004
Hardcover

Top Search Results from the AbeBooks Marketplace

1.

Published by Springer-Verlag New York Inc., United States (2014)
ISBN 10: 1461347718 ISBN 13: 9781461347712
New Paperback Quantity Available: 10
Print on Demand
Seller:
The Book Depository
(London, United Kingdom)
Rating
[?]

Book Description Springer-Verlag New York Inc., United States, 2014. Paperback. Condition: New. Language: English . Brand New Book ***** Print on Demand *****.This book presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films. It comprises two main parts, i.e. electrical characterization in nanoscale ferroelectric capacitor, and nano domain manipulation and visualization in ferroelectric materials. Well- known le adingexperts both in relevant academia and industry over the world (U.S., Japan, Germany, Switzerland, Korea) were invited to contribute to each chapter. The first part under the title of electrical characterization in nanoscale ferroelectric capacitors starts with Chapter 1, Testing and characterization of ferroelectric thin film capacitors, written by Dr. I. K. Yoo. The author provides a comprehensive review on basic concepts and terminologies of ferroelectric properties and their testing methods. This chapter also covers reliability issues in FeRAMs that are crucial for commercialization of high- density memory products. In Chapter 2, Size effects in ferroelectric film capacitors: role ofthe film thickness and capacitor size, Dr. I. Stolichnov discusses the size effects both in in-plane and out-of-plane dimensions of the ferroelectric thin film. The author successfully relates the electric performance and domain dynamics with proposed models of charge injection and stress induced phase transition. The author s findings present both a challenging problem and the clue to its solution of reliably predicting the switching properties for ultra-thin ferroelectric capacitors. In Chapter 3, Ferroelectric thin films for memory applications: nanoscale characterization by scanning force microscopy, Prof. A. Softcover reprint of the original 1st ed. 2004. Seller Inventory # AAV9781461347712

More information about this seller | Contact this seller

Buy New
US$ 199.31
Convert currency

Add to Basket

Shipping: FREE
From United Kingdom to U.S.A.
Destination, rates & speeds

2.

Published by Springer-Verlag New York Inc., United States (2014)
ISBN 10: 1461347718 ISBN 13: 9781461347712
New Paperback Quantity Available: 10
Seller:
Book Depository hard to find
(London, United Kingdom)
Rating
[?]

Book Description Springer-Verlag New York Inc., United States, 2014. Paperback. Condition: New. Language: English . This book usually ship within 10-15 business days and we will endeavor to dispatch orders quicker than this where possible. Brand New Book. This book presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films. It comprises two main parts, i.e. electrical characterization in nanoscale ferroelectric capacitor, and nano domain manipulation and visualization in ferroelectric materials. Well- known le adingexperts both in relevant academia and industry over the world (U.S., Japan, Germany, Switzerland, Korea) were invited to contribute to each chapter. The first part under the title of electrical characterization in nanoscale ferroelectric capacitors starts with Chapter 1, Testing and characterization of ferroelectric thin film capacitors, written by Dr. I. K. Yoo. The author provides a comprehensive review on basic concepts and terminologies of ferroelectric properties and their testing methods. This chapter also covers reliability issues in FeRAMs that are crucial for commercialization of high- density memory products. In Chapter 2, Size effects in ferroelectric film capacitors: role ofthe film thickness and capacitor size, Dr. I. Stolichnov discusses the size effects both in in-plane and out-of-plane dimensions of the ferroelectric thin film. The author successfully relates the electric performance and domain dynamics with proposed models of charge injection and stress induced phase transition. The author s findings present both a challenging problem and the clue to its solution of reliably predicting the switching properties for ultra-thin ferroelectric capacitors. In Chapter 3, Ferroelectric thin films for memory applications: nanoscale characterization by scanning force microscopy, Prof. A. Softcover reprint of the original 1st ed. 2004. Seller Inventory # LIE9781461347712

More information about this seller | Contact this seller

Buy New
US$ 200.96
Convert currency

Add to Basket

Shipping: FREE
From United Kingdom to U.S.A.
Destination, rates & speeds

3.

Published by Springer-Verlag New York Inc., United States (2014)
ISBN 10: 1461347718 ISBN 13: 9781461347712
New Paperback Quantity Available: 10
Print on Demand
Seller:
Book Depository International
(London, United Kingdom)
Rating
[?]

Book Description Springer-Verlag New York Inc., United States, 2014. Paperback. Condition: New. Language: English . Brand New Book ***** Print on Demand *****. This book presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films. It comprises two main parts, i.e. electrical characterization in nanoscale ferroelectric capacitor, and nano domain manipulation and visualization in ferroelectric materials. Well- known le adingexperts both in relevant academia and industry over the world (U.S., Japan, Germany, Switzerland, Korea) were invited to contribute to each chapter. The first part under the title of electrical characterization in nanoscale ferroelectric capacitors starts with Chapter 1, Testing and characterization of ferroelectric thin film capacitors, written by Dr. I. K. Yoo. The author provides a comprehensive review on basic concepts and terminologies of ferroelectric properties and their testing methods. This chapter also covers reliability issues in FeRAMs that are crucial for commercialization of high- density memory products. In Chapter 2, Size effects in ferroelectric film capacitors: role ofthe film thickness and capacitor size, Dr. I. Stolichnov discusses the size effects both in in-plane and out-of-plane dimensions of the ferroelectric thin film. The author successfully relates the electric performance and domain dynamics with proposed models of charge injection and stress induced phase transition. The author s findings present both a challenging problem and the clue to its solution of reliably predicting the switching properties for ultra-thin ferroelectric capacitors. In Chapter 3, Ferroelectric thin films for memory applications: nanoscale characterization by scanning force microscopy, Prof. A. Softcover reprint of the original 1st ed. 2004. Seller Inventory # AAV9781461347712

More information about this seller | Contact this seller

Buy New
US$ 204.26
Convert currency

Add to Basket

Shipping: FREE
From United Kingdom to U.S.A.
Destination, rates & speeds

4.

SEUNGBUM HONG
Published by Springer (2014)
ISBN 10: 1461347718 ISBN 13: 9781461347712
New Paperback Quantity Available: 1
Seller:
Herb Tandree Philosophy Books
(Stroud, GLOS, United Kingdom)
Rating
[?]

Book Description Springer, 2014. Paperback. Condition: NEW. 9781461347712 This listing is a new book, a title currently in-print which we order directly and immediately from the publisher. For all enquiries, please contact Herb Tandree Philosophy Books directly - customer service is our primary goal. Seller Inventory # HTANDREE0735989

More information about this seller | Contact this seller

Buy New
US$ 194.24
Convert currency

Add to Basket

Shipping: US$ 10.52
From United Kingdom to U.S.A.
Destination, rates & speeds

5.

Published by Springer (2018)
ISBN 10: 1461347718 ISBN 13: 9781461347712
New Paperback Quantity Available: 15
Print on Demand
Seller:
Murray Media
(NORTH MIAMI BEACH, FL, U.S.A.)
Rating
[?]

Book Description Springer, 2018. Paperback. Condition: New. Never used! This item is printed on demand. Seller Inventory # 1461347718

More information about this seller | Contact this seller

Buy New
US$ 223.52
Convert currency

Add to Basket

Shipping: FREE
Within U.S.A.
Destination, rates & speeds

6.

Seungbum Hong
Published by Springer (2016)
ISBN 10: 1461347718 ISBN 13: 9781461347712
New Paperback Quantity Available: 1
Print on Demand
Seller:
Ria Christie Collections
(Uxbridge, United Kingdom)
Rating
[?]

Book Description Springer, 2016. Paperback. Condition: New. PRINT ON DEMAND Book; New; Publication Year 2016; Not Signed; Fast Shipping from the UK. No. book. Seller Inventory # ria9781461347712_lsuk

More information about this seller | Contact this seller

Buy New
US$ 227.42
Convert currency

Add to Basket

Shipping: US$ 5.10
From United Kingdom to U.S.A.
Destination, rates & speeds

7.

Seungbum Hong
Published by Springer-Verlag New York Inc. (2014)
ISBN 10: 1461347718 ISBN 13: 9781461347712
New Quantity Available: > 20
Print on Demand
Seller:
Books2Anywhere
(Fairford, GLOS, United Kingdom)
Rating
[?]

Book Description Springer-Verlag New York Inc., 2014. PAP. Condition: New. New Book. Delivered from our UK warehouse in 3 to 5 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Seller Inventory # LQ-9781461347712

More information about this seller | Contact this seller

Buy New
US$ 233.30
Convert currency

Add to Basket

Shipping: US$ 11.87
From United Kingdom to U.S.A.
Destination, rates & speeds

8.

Seungbum Hong
Published by Springer-Verlag New York Inc. (2014)
ISBN 10: 1461347718 ISBN 13: 9781461347712
New Quantity Available: > 20
Print on Demand
Seller:
Pbshop
(Wood Dale, IL, U.S.A.)
Rating
[?]

Book Description Springer-Verlag New York Inc., 2014. PAP. Condition: New. New Book. Shipped from US within 10 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Seller Inventory # IQ-9781461347712

More information about this seller | Contact this seller

Buy New
US$ 247.01
Convert currency

Add to Basket

Shipping: US$ 3.99
Within U.S.A.
Destination, rates & speeds

9.

Published by Springer (2014)
ISBN 10: 1461347718 ISBN 13: 9781461347712
New Softcover Quantity Available: 15
Print on Demand
Seller:
Rating
[?]

Book Description Springer, 2014. Condition: New. This item is printed on demand for shipment within 3 working days. Seller Inventory # LP9781461347712

More information about this seller | Contact this seller

Buy New
US$ 260.41
Convert currency

Add to Basket

Shipping: US$ 3.46
From Germany to U.S.A.
Destination, rates & speeds

10.

Published by Springer (2014)
ISBN 10: 1461347718 ISBN 13: 9781461347712
New Paperback Quantity Available: 2
Seller:
Revaluation Books
(Exeter, United Kingdom)
Rating
[?]

Book Description Springer, 2014. Paperback. Condition: Brand New. 9.30x6.20 inches. In Stock. Seller Inventory # x-1461347718

More information about this seller | Contact this seller

Buy New
US$ 275.01
Convert currency

Add to Basket

Shipping: US$ 9.89
From United Kingdom to U.S.A.
Destination, rates & speeds