Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

0 avg rating
( 0 ratings by GoodReads )
9781461443360: Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature.

The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability.  Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.

"synopsis" may belong to another edition of this title.

About the Author:

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for modern electron and photonic devices. These devices include lasers and high speed electronics used in all aspects of our lives, from cell phones to satellites, data transmission systems and displays. Lifetime prediction for compound semiconductor device operation is notoriously inaccurate due to the fragmented efforts in reliability and the absence of standard protocols. Manufacturers have usually relied on accelerated testing at elevated temperature and then extrapolated back to room temperature operation. This technique frequently fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. Device degradation can be driven by failure in either active structures or passivation layers.

The Handbook addresses reliability engineering for III-V device structures, including materials and electrical characterization, reliability testing, and electronic characterization. These last techniques are used to develop new simulation technologies for device operation and reliability, which in turn allow accurate prediction of reliability as well as the design of structures specifically for improved reliability of operation. Given that a relatively small percentage of devices will actually show failure, it is critical to both enhance the failure rate through accelerated testing and to treat the resulting reliability data correctly. For this reason, the Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. In other words, accelerated aging is useful only if we know the failure mechanism. Also covered are standard Si reliability approaches to determine the instantaneous failure rate and mean time to failure and therefore the distribution functions of greatest relevance to the specific device technology. Furthermore, the Handbook focuses attention on voltage and current acceleration stress mechanisms.

"About this title" may belong to another edition of this title.

Top Search Results from the AbeBooks Marketplace

1.

ISBN 10: 1461443369 ISBN 13: 9781461443360
New Quantity Available: 20
Seller
BWB
(Valley Stream, NY, U.S.A.)
Rating
[?]

Book Description Book Condition: New. Depending on your location, this item may ship from the US or UK. Bookseller Inventory # 97814614433600000000

More Information About This Seller | Ask Bookseller a Question

Buy New
US$ 161.16
Convert Currency

Add to Basket

Shipping: FREE
Within U.S.A.
Destination, Rates & Speeds

2.

Published by Springer-Verlag New York Inc., United States (2012)
ISBN 10: 1461443369 ISBN 13: 9781461443360
New Hardcover Quantity Available: 10
Seller
The Book Depository US
(London, United Kingdom)
Rating
[?]

Book Description Springer-Verlag New York Inc., United States, 2012. Hardback. Book Condition: New. 2013 ed.. 242 x 166 mm. Language: English . Brand New Book. Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms. Bookseller Inventory # SPR9781461443360

More Information About This Seller | Ask Bookseller a Question

Buy New
US$ 163.77
Convert Currency

Add to Basket

Shipping: FREE
From United Kingdom to U.S.A.
Destination, Rates & Speeds

3.

Published by Springer-Verlag New York Inc., United States (2012)
ISBN 10: 1461443369 ISBN 13: 9781461443360
New Hardcover Quantity Available: 10
Seller
The Book Depository
(London, United Kingdom)
Rating
[?]

Book Description Springer-Verlag New York Inc., United States, 2012. Hardback. Book Condition: New. 2013 ed.. 242 x 166 mm. Language: English . Brand New Book. Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms. Bookseller Inventory # SPR9781461443360

More Information About This Seller | Ask Bookseller a Question

Buy New
US$ 172.00
Convert Currency

Add to Basket

Shipping: FREE
From United Kingdom to U.S.A.
Destination, Rates & Speeds

4.

Ueda, Osamu (Editor)/ Pearton, Stephen J. (Editor)
Published by Springer Verlag (2012)
ISBN 10: 1461443369 ISBN 13: 9781461443360
New Hardcover Quantity Available: 2
Seller
Revaluation Books
(Exeter, United Kingdom)
Rating
[?]

Book Description Springer Verlag, 2012. Hardcover. Book Condition: Brand New. 2013 edition. 631 pages. 9.25x6.25x1.50 inches. In Stock. Bookseller Inventory # __1461443369

More Information About This Seller | Ask Bookseller a Question

Buy New
US$ 191.63
Convert Currency

Add to Basket

Shipping: US$ 7.49
From United Kingdom to U.S.A.
Destination, Rates & Speeds

5.

Osamu Ueda
Published by Springer-Verlag New York Inc. (2012)
ISBN 10: 1461443369 ISBN 13: 9781461443360
New Quantity Available: > 20
Print on Demand
Seller
PBShop
(Wood Dale, IL, U.S.A.)
Rating
[?]

Book Description Springer-Verlag New York Inc., 2012. HRD. Book Condition: New. New Book. Shipped from US within 10 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Bookseller Inventory # I1-9781461443360

More Information About This Seller | Ask Bookseller a Question

Buy New
US$ 206.72
Convert Currency

Add to Basket

Shipping: US$ 3.99
Within U.S.A.
Destination, Rates & Speeds

6.

Osamu Ueda
Published by Springer-Verlag New York Inc. (2012)
ISBN 10: 1461443369 ISBN 13: 9781461443360
New Quantity Available: > 20
Print on Demand
Seller
Books2Anywhere
(Fairford, GLOS, United Kingdom)
Rating
[?]

Book Description Springer-Verlag New York Inc., 2012. HRD. Book Condition: New. New Book. Delivered from our US warehouse in 10 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Bookseller Inventory # I1-9781461443360

More Information About This Seller | Ask Bookseller a Question

Buy New
US$ 208.52
Convert Currency

Add to Basket

Shipping: US$ 11.24
From United Kingdom to U.S.A.
Destination, Rates & Speeds

7.

OSAMU UEDA
Published by Springer (2012)
ISBN 10: 1461443369 ISBN 13: 9781461443360
New Hardcover Quantity Available: 1
Seller
Herb Tandree Philosophy Books
(Stroud, GLOS, United Kingdom)
Rating
[?]

Book Description Springer, 2012. Hardback. Book Condition: NEW. 9781461443360 This listing is a new book, a title currently in-print which we order directly and immediately from the publisher. Bookseller Inventory # HTANDREE0305059

More Information About This Seller | Ask Bookseller a Question

Buy New
US$ 210.79
Convert Currency

Add to Basket

Shipping: US$ 9.99
From United Kingdom to U.S.A.
Destination, Rates & Speeds

8.

Ueda, Osamu (EDT)/ Pearton, Stephen J. (EDT)
Published by Springer-Verlag New York Inc. 2012-09-24, New York, NY (2012)
ISBN 10: 1461443369 ISBN 13: 9781461443360
New Hardcover Quantity Available: > 20
Seller
Blackwell's
(Oxford, OX, United Kingdom)
Rating
[?]

Book Description Springer-Verlag New York Inc. 2012-09-24, New York, NY, 2012. hardback. Book Condition: New. Bookseller Inventory # 9781461443360

More Information About This Seller | Ask Bookseller a Question

Buy New
US$ 215.65
Convert Currency

Add to Basket

Shipping: US$ 5.62
From United Kingdom to U.S.A.
Destination, Rates & Speeds

9.

Published by Springer (2012)
ISBN 10: 1461443369 ISBN 13: 9781461443360
New Hardcover Quantity Available: 1
Seller
Irish Booksellers
(Rumford, ME, U.S.A.)
Rating
[?]

Book Description Springer, 2012. Hardcover. Book Condition: New. book. Bookseller Inventory # 1461443369

More Information About This Seller | Ask Bookseller a Question

Buy New
US$ 236.92
Convert Currency

Add to Basket

Shipping: FREE
Within U.S.A.
Destination, Rates & Speeds

10.

Ueda, Osamu
Published by Springer (2016)
ISBN 10: 1461443369 ISBN 13: 9781461443360
New Paperback Quantity Available: 1
Print on Demand
Seller
Ria Christie Collections
(Uxbridge, United Kingdom)
Rating
[?]

Book Description Springer, 2016. Paperback. Book Condition: New. PRINT ON DEMAND Book; New; Publication Year 2016; Not Signed; Fast Shipping from the UK. No. book. Bookseller Inventory # ria9781461443360_lsuk

More Information About This Seller | Ask Bookseller a Question

Buy New
US$ 236.13
Convert Currency

Add to Basket

Shipping: US$ 4.18
From United Kingdom to U.S.A.
Destination, Rates & Speeds

There are more copies of this book

View all search results for this book