Items related to Ion Beam Surface Layer Analysis: Volume 2
The II. International Conference on Ion Beam Surface Layer Analysis was held on September 15-19, 1975 at the Nuclear Research Center, Karlsruhe, Germany. The date fell between two related con ferences: "Application of Ion-Beams to Materials" at Warwick, Eng land and "Atomic Collisions in Solids" at Amsterdam, the Nether lands. The first conference on Ion Beam Surface Layer Analysis was held at Yorktown Heights, New York, 1973. The major topic of that and the present conference was the material analysis with ion beams including backscattering and channeling, nuclear reactions and ion induced X-rays with emphasis on technical problems and no vel applications. The increasing interest in this field was docu mented by 7 invited papers and 85 contributions which were presen ted at the meeting in Karlsruhe to about 150 participants from 21 countries. The oral presentations were followed by parallel ses sions on "Fundamental Aspects", "Analytical Problems" and "Appli cations" encouraging detailed discussions on the topics of most current interest. Summaries of these sessions were presented by the discussion leaders to the whole conference. All invited and contributed papers are included in these proceedings; summaries of the discussion sessions will appear in a separate booklet and are availble from the editors. The application of ion beams to material analysis is now well established.
"synopsis" may belong to another edition of this title.
- PublisherSpringer
- Publication date2012
- ISBN 10 1461588812
- ISBN 13 9781461588818
- BindingPaperback
- Number of pages508
Buy New
Learn more about this copy
US$ 57.03
Shipping:
FREE
Within U.S.A.
Other Popular Editions of the Same Title
Top Search Results from the AbeBooks Marketplace
Seller Image
Ion Beam Surface Layer Analysis: Volume 2 by Meyer, Otto [Paperback ]
Print on Demand
Seller:
Rating
Book Description Soft Cover. Condition: new. This item is printed on demand. Seller Inventory # 9781461588818
Buy New
US$ 57.03
Convert currency
Stock Image
Ion Beam Surface Layer Analysis: Volume 2
Published by
Springer
(2012)
ISBN 10: 1461588812
ISBN 13: 9781461588818
New
Softcover
Quantity: > 20
Seller:
Rating
Book Description Condition: New. Seller Inventory # ABLIING23Mar2716030038365
Buy New
US$ 60.03
Convert currency
Stock Image
Ion Beam Surface Layer Analysis : Volume 2
Published by
Springer
(2012)
ISBN 10: 1461588812
ISBN 13: 9781461588818
New
Softcover
Quantity: > 20
Seller:
Rating
Book Description Condition: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book. Seller Inventory # ria9781461588818_lsuk
Buy New
US$ 64.40
Convert currency
Stock Image
Ion Beam Surface Layer Analysis: Volume 2
Published by
Springer-Verlag New York Inc.
(2012)
ISBN 10: 1461588812
ISBN 13: 9781461588818
New
Paperback / softback
Quantity: > 20
Seller:
Rating
Book Description Paperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days. Seller Inventory # C9781461588818
Buy New
US$ 73.53
Convert currency
Stock Image
Ion Beam Surface Layer Analysis: Volume 2
Seller:
Rating
Book Description Paperback. Condition: Brand New. 508 pages. 10.00x7.01x1.16 inches. In Stock. Seller Inventory # x-1461588812
Buy New
US$ 82.37
Convert currency
Seller Image
Ion Beam Surface Layer Analysis : Volume 2
Published by
Springer US
(2012)
ISBN 10: 1461588812
ISBN 13: 9781461588818
New
Taschenbuch
Quantity: 1
Seller:
Rating
Book Description Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The II. International Conference on Ion Beam Surface Layer Analysis was held on September 15-19, 1975 at the Nuclear Research Center, Karlsruhe, Germany. The date fell between two related con ferences: 'Application of Ion-Beams to Materials' at Warwick, Eng land and 'Atomic Collisions in Solids' at Amsterdam, the Nether lands. The first conference on Ion Beam Surface Layer Analysis was held at Yorktown Heights, New York, 1973. The major topic of that and the present conference was the material analysis with ion beams including backscattering and channeling, nuclear reactions and ion induced X-rays with emphasis on technical problems and no vel applications. The increasing interest in this field was docu mented by 7 invited papers and 85 contributions which were presen ted at the meeting in Karlsruhe to about 150 participants from 21 countries. The oral presentations were followed by parallel ses sions on 'Fundamental Aspects', 'Analytical Problems' and 'Appli cations' encouraging detailed discussions on the topics of most current interest. Summaries of these sessions were presented by the discussion leaders to the whole conference. All invited and contributed papers are included in these proceedings; summaries of the discussion sessions will appear in a separate booklet and are availble from the editors. The application of ion beams to material analysis is now well established. Seller Inventory # 9781461588818
Buy New
US$ 66.48
Convert currency
Seller Image
Ion Beam Surface Layer Analysis
Published by
Springer US
(2012)
ISBN 10: 1461588812
ISBN 13: 9781461588818
New
Softcover
Quantity: > 20
Seller:
Rating
Book Description Condition: New. Seller Inventory # 4200646
Buy New
US$ 53.32
Convert currency
Stock Image
Ion Beam Surface Layer Analysis : Volume 2
Seller:
Rating
Book Description PF. Condition: New. Seller Inventory # 6666-IUK-9781461588818
Buy New
US$ 91.92
Convert currency
Seller Image
Ion Beam Surface Layer Analysis
Published by
Springer US Jan 2012
(2012)
ISBN 10: 1461588812
ISBN 13: 9781461588818
New
Taschenbuch
Quantity: 2
Seller:
Rating
Book Description Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The II. International Conference on Ion Beam Surface Layer Analysis was held on September 15-19, 1975 at the Nuclear Research Center, Karlsruhe, Germany. The date fell between two related con ferences: 'Application of Ion-Beams to Materials' at Warwick, Eng land and 'Atomic Collisions in Solids' at Amsterdam, the Nether lands. The first conference on Ion Beam Surface Layer Analysis was held at Yorktown Heights, New York, 1973. The major topic of that and the present conference was the material analysis with ion beams including backscattering and channeling, nuclear reactions and ion induced X-rays with emphasis on technical problems and no vel applications. The increasing interest in this field was docu mented by 7 invited papers and 85 contributions which were presen ted at the meeting in Karlsruhe to about 150 participants from 21 countries. The oral presentations were followed by parallel ses sions on 'Fundamental Aspects', 'Analytical Problems' and 'Appli cations' encouraging detailed discussions on the topics of most current interest. Summaries of these sessions were presented by the discussion leaders to the whole conference. All invited and contributed papers are included in these proceedings; summaries of the discussion sessions will appear in a separate booklet and are availble from the editors. The application of ion beams to material analysis is now well established. 512 pp. Englisch. Seller Inventory # 9781461588818
Buy New
US$ 94.31
Convert currency