For a manufacturing activity to remain competitive, engineers must rigorously apply statistics methodologies that enable them to understand the sources and consequences of uncontrolled process variation. In this example-rich text, author Jack Reece explains simple comparative statistics and demonstrates how to use JMP to examine raw data graphically and to generate regression models involving fixed and random effects. The following major topics are addressed:
Although many of the examples rely on case studies, largely in the semiconductor manufacturing area, the principles described and the methods used apply generally to the study of any process or manufacturing activity. This book assumes that the reader has some knowledge of JMP software, but does not assume extensive statistical knowledge.
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Jack E. Reece, Ph.D., writes from 20 years' experience in converting laboratory results into successful commercial operations. During a 15-year career at Minnesota Mining and Manufacturing Company, Jack made fundamental contributions in a variety of industry applications, including fine organics, photographic chemistry, and solvent-case coating technology for unconventional imaging systems. In addition, Jack contributed his process engineering and applied statistics expertise at several leading companies, including Phillips Petroleum Company, ECD, Honeywell, Inc., and SEMATECH. He continued to share his knowledge of the industry with companies in the U.S. and abroad through his consulting company, Reece Associates Ltd. Jack became a Senior Fellow in statistical methods using SAS software in 1992 and became a JMP user in 2002.Review:
"Many sources contribute to the overall variability of manufactured products. The author first determines the appropriateness of measurement instruments while simultaneously illustrating the use of JMP for the manipulation of data tables, graphs, and the design of experiments. His later objective is the estimation of components of variability assignable to the environment, operators, and process variables. The examples here range from the very simple to quite sophisticated. The text ends with an excellent introduction to quality-control charting." --J. Stuart Hunter, Professor Emeritus, School of Engineering and Applied Science, Princeton University
"What makes this book particularly useful is how it walks the JMP user through the entire analysis process, making it essentially a statistics book using JMP visuals and examples. Within each section, the text does not just show how to use a tool or test; it explains why one should use the tool, enabling the user to better understand the end results of the data set. I look forward to putting this book to everyday use at the plant." --Kevin Coley, Quality Engineer, Technimark Inc.
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Book Description SAS Institute, 2007. Paperback. Book Condition: New. Bookseller Inventory # P111590478851