PMP®/CAPM® EXAM PREP: A Basic Guide to Activity-On-Node and Critical Path Method

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9781614345046: PMP®/CAPM® EXAM PREP: A Basic Guide to Activity-On-Node and Critical Path Method

A thorough and in-depth preparation guide for PMP® and CAPM® exams covering Precedence Diagramming Method/Activity-On-Node concepts and their analysis using Critical Path Method. This guide explains the concepts with illustrated examples with emphasis on special situations. Explanation of concepts through stepwise solved examples will provide readers hands-on ability for their application. This guide will serve as a launch pad for advanced study in this area beyond the requirements of the two exams.

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Book Description Booklocker Inc.,US, United States, 2011. Paperback. Book Condition: New. Language: English . Brand New Book ***** Print on Demand *****. A thorough and in-depth preparation guide for PMP(R) and CAPM(R) exams covering Precedence Diagramming Method/Activity-On-Node concepts and their analysis using Critical Path Method. This guide explains the concepts with illustrated examples with emphasis on special situations. Explanation of concepts through stepwise solved examples will provide readers hands-on ability for their application. This guide will serve as a launch pad for advanced study in this area beyond the requirements of the two exams. Bookseller Inventory # AAV9781614345046

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Book Description Booklocker Inc.,US, United States, 2011. Paperback. Book Condition: New. Language: English . Brand New Book ***** Print on Demand *****.A thorough and in-depth preparation guide for PMP(R) and CAPM(R) exams covering Precedence Diagramming Method/Activity-On-Node concepts and their analysis using Critical Path Method. This guide explains the concepts with illustrated examples with emphasis on special situations. Explanation of concepts through stepwise solved examples will provide readers hands-on ability for their application. This guide will serve as a launch pad for advanced study in this area beyond the requirements of the two exams. Bookseller Inventory # AAV9781614345046

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Book Description Booklocker Inc.,US, United States, 2011. Paperback. Book Condition: New. Language: English . This book usually ship within 10-15 business days and we will endeavor to dispatch orders quicker than this where possible. Brand New Book. A thorough and in-depth preparation guide for PMP(R) and CAPM(R) exams covering Precedence Diagramming Method/Activity-On-Node concepts and their analysis using Critical Path Method. This guide explains the concepts with illustrated examples with emphasis on special situations. Explanation of concepts through stepwise solved examples will provide readers hands-on ability for their application. This guide will serve as a launch pad for advanced study in this area beyond the requirements of the two exams. Bookseller Inventory # LIE9781614345046

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Book Description Booklocker.com. Paperback. Book Condition: New. 118 pages. Dimensions: 9.9in. x 6.8in. x 0.5in.A thorough and in-depth preparation guide for PMP and CAPM exams covering Precedence Diagramming MethodActivity-On-Node concepts and their analysis using Critical Path Method. This guide explains the concepts with illustrated examples with emphasis on special situations. Explanation of concepts through stepwise solved examples will provide readers hands-on ability for their application. This guide will serve as a launch pad for advanced study in this area beyond the requirements of the two exams. This item ships from multiple locations. Your book may arrive from Roseburg,OR, La Vergne,TN. Paperback. Bookseller Inventory # 9781614345046

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