Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging Analysis

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9781848167896: Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging Analysis

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.

Readership: Graduate students and researchers in the field of nanomaterials and nanostructures.

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Nobuo Tanaka
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Book Description Imperial College Press, United Kingdom, 2014. Hardback. Book Condition: New. Language: English . Brand New Book. The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials. Bookseller Inventory # AAJ9781848167896

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Nobuo Tanaka
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Book Description Imperial College Press, United Kingdom, 2014. Hardback. Book Condition: New. Language: English . Brand New Book. The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials. Bookseller Inventory # AAJ9781848167896

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Book Description Imperial College Pr, 2014. Hardcover. Book Condition: Brand New. 400 pages. 9.00x6.25x1.25 inches. In Stock. Bookseller Inventory # __184816789X

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