Items related to Computational Surface and Roundness Metrology
This book provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. There are examples, illustrations and exercises included.
"synopsis" may belong to another edition of this title.
From the Back Cover:
About the Author:
Computational Surface and Roundness Metrology provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. The book, in combination with a mathematical package or programming language interface, provides an invaluable tool for experimenting, learning, and discovering the many flavors of mathematics that are so routinely taken for granted in metrology.
Whether the objective is to understand the origin of that ubiquitous transmission characteristics curve of a filter we see so often yet do not quite comprehend, or to delve into the intricate depths of a deceptively simple problem of fitting a line or a plane to a set of points, Computational Surface and Roundness Metrology describes it all (in exhaustive detail) using examples, illustrations, exercises, and a link to some of the finest publications in the field for over half a century.
From the graduate student of metrology to the practicing engineer on the shop floor, Computational Surface and Roundness Metrology is a must-have reference for all involved in metrology, instrumentation/optics, manufacturing, and electronics.
Bala Muralikrishnan has a PhD in Mechanical Engineering from the University of North Carolina at Charlotte, USA. He works for the National Institute of Standards and Technology, where he is a guest researcher in the Engineering Metrology Group of the Precision Engineering Division - one of the divisions of the Manufacturing Engineering Laboratory.
Jayaraman Raja has a PhD in Mechanical Engineering from the Indian Institute of Technology, Madras, India. He is a professor and chairman in the Department of Mechanical Engineering & Engineering Science at the University of North Carolina at Charlotte, USA. His research interests include Surface & Form Metrology; Computational Metrology; and Precision Engineering.
"About this title" may belong to another edition of this title.
- PublisherSpringer
- Publication date2010
- ISBN 10 1849967733
- ISBN 13 9781849967730
- BindingPaperback
- Number of pages283
Buy New
Learn more about this copy
US$ 168.56
Shipping:
FREE
Within U.S.A.
Top Search Results from the AbeBooks Marketplace
Seller Image
Computational Surface and Roundness Metrology by Muralikrishnan, Balasubramanian [Paperback ]
Seller:
Rating
Book Description Soft Cover. Condition: new. Seller Inventory # 9781849967730
Buy New
US$ 168.56
Convert currency
Stock Image
Computational Surface and Roundness Metrology
Published by
Springer
(2010)
ISBN 10: 1849967733
ISBN 13: 9781849967730
New
Softcover
Quantity: > 20
Seller:
Rating
Book Description Condition: New. Seller Inventory # ABLIING23Mar2912160255063
Buy New
US$ 178.25
Convert currency
Seller Image
Computational Surface and Roundness Metrology
Published by
Springer London Okt 2010
(2010)
ISBN 10: 1849967733
ISBN 13: 9781849967730
New
Taschenbuch
Quantity: 2
Seller:
Rating
Book Description Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -'Computational Surface and Roundness Metrology' provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. The book, in combination with a mathematical package or programming language interface, provides an invaluable tool for experimenting, learning, and discovering the many flavors of mathematics that are so routinely taken for granted in metrology. Whether the objective is to understand the origin of that ubiquitous transmission characteristics curve of a filter we see so often yet do not quite comprehend, or to delve into the intricate depths of a deceptively simple problem of fitting a line or a plane to a set of points, this book describes it all (in exhaustive detail). From the graduate student of metrology to the practicing engineer on the shop floor, this book is a must-have reference for all involved in metrology, instrumentation/optics, manufacturing, and electronics. 284 pp. Englisch. Seller Inventory # 9781849967730
Buy New
US$ 176.36
Convert currency
Stock Image
Computational Surface and Roundness Metrology
Published by
Springer
(2010)
ISBN 10: 1849967733
ISBN 13: 9781849967730
New
Softcover
Quantity: > 20
Seller:
Rating
Book Description Condition: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book. Seller Inventory # ria9781849967730_lsuk
Buy New
US$ 189.16
Convert currency
Seller Image
Computational Surface and Roundness Metrology
Published by
Springer London
(2010)
ISBN 10: 1849967733
ISBN 13: 9781849967730
New
Softcover
Quantity: > 20
Seller:
Rating
Book Description Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides a practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysisBala Muralikrishnan has a PhD in Mechanical Engineering from the Universi. Seller Inventory # 4288860
Buy New
US$ 149.62
Convert currency
Seller Image
Computational Surface and Roundness Metrology
Published by
Springer London
(2010)
ISBN 10: 1849967733
ISBN 13: 9781849967730
New
Taschenbuch
Quantity: 1
Seller:
Rating
Book Description Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - 'Computational Surface and Roundness Metrology' provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. The book, in combination with a mathematical package or programming language interface, provides an invaluable tool for experimenting, learning, and discovering the many flavors of mathematics that are so routinely taken for granted in metrology. Whether the objective is to understand the origin of that ubiquitous transmission characteristics curve of a filter we see so often yet do not quite comprehend, or to delve into the intricate depths of a deceptively simple problem of fitting a line or a plane to a set of points, this book describes it all (in exhaustive detail). From the graduate student of metrology to the practicing engineer on the shop floor, this book is a must-have reference for all involved in metrology, instrumentation/optics, manufacturing, and electronics. Seller Inventory # 9781849967730
Buy New
US$ 178.48
Convert currency