Three Dimensional Surface Topography (Ultra Precision Technology Series)

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9781857180268: Three Dimensional Surface Topography (Ultra Precision Technology Series)

This fully illustrated text explains the basic measurement techniques, describes the commercially available instruments and provides an overview of the current perception of 3-D topography analysis in the academic world and industry, and the commonly used 3-D parameters and plots for the characterizing and visualizing 3-D surface topography.

It also includes new sections providing full treatment of surface characterization, filtering technology and engineered surfaces, as well as a fully updated bibliography.

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From the Publisher:

Development Of Methods For The Characterisation Of Roughness In Three Dimensions will be the standard work on 3-D surface characterization as it contains for the first time the basis for a unified approach to the subject, as well as for the new 3-D INTERNATIONAL STANDARD.

The book will be of immediate interest to specialists in Micro Instrumentation, Precision Engineering Practitioners and Academics, to Mechanical, Quality Assurance and Production Engineers, and to Metrology Researchers, Standards Institutes, Metrology Manufacturing Companies and Metrology Software Companies.

This is an updated version of a noted previous publication, that has tradidionally been very difficult to get hold of. It is essentially the "Bible" of the subject of 3-D surface characterization. Practitioners in this or related fields would consider this book a standard text.

About the Author:

Professor Liam Blunt is Taylor Hobson Professor of Surface Metrology at the University of Huddersfield, UK. He is author of numerous published papers and other contributions on surface technology, and is co-author with Ken Stout of Three Dimensional Surface Topography (published by Penton Press, 2000).

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K. J. Stout, Liam Blunt
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Book Description ELSEVIER SCIENCE TECHNOLOGY, United Kingdom, 2000. Hardback. Book Condition: New. 2nd Revised edition. Language: English . Brand New Book. This fully illustrated text explains the basic measurement techniques, describes the commercially available instruments and provides an overview of the current perception of 3-D topography analysis in the academic world and industry, and the commonly used 3-D parameters and plots for the characterizing and visualizing 3-D surface topography. It also includes new sections providing full treatment of surface characterization, filtering technology and engineered surfaces, as well as a fully updated bibliography. Bookseller Inventory # AA59781857180268

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K. J. Stout, Liam Blunt
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Book Description ELSEVIER SCIENCE TECHNOLOGY, United Kingdom, 2000. Hardback. Book Condition: New. 2nd Revised edition. Language: English . Brand New Book. This fully illustrated text explains the basic measurement techniques, describes the commercially available instruments and provides an overview of the current perception of 3-D topography analysis in the academic world and industry, and the commonly used 3-D parameters and plots for the characterizing and visualizing 3-D surface topography. It also includes new sections providing full treatment of surface characterization, filtering technology and engineered surfaces, as well as a fully updated bibliography. Bookseller Inventory # AA59781857180268

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Stout, K. J. (Editor)/ Blunt, L. (Editor)/ Jiang, Jane X. Q./ Wang, Kong Hua/ Mainsah, Evaristus/ Sullivan, Paul J./ Dong, Weiping/ Luo, Naili
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