Nanoscale Calibration Standards and Methods: Dimensional and Related Measurements in the Micro and Nanometer Range

0 avg rating
( 0 ratings by Goodreads )
 
9783527405022: Nanoscale Calibration Standards and Methods: Dimensional and Related Measurements in the Micro and Nanometer Range
View all copies of this ISBN edition:
 
 

The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry.

Topics addressed in these proceedings are
a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing
b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements
c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing

"synopsis" may belong to another edition of this title.

From the Back Cover:

The quantitative determination of the properties of micro- and nanostructures is essential in research and development. Here, peer-reviewed papers are presented with contributions for the NanoScale 2004 seminar at the Physikalisch-Technische Bundesanstalt (PTB), Braunschweig, Germany, in March 2004. Topics include problems of quantitative measurement as well as methods of calibration, correction and instrumentation. The seminar stimulates the exchange of information between users in science and industry and manufacturers of the relevant hard- and software.

About the Author:

G�nter Wilkening, Prof. Dr., Physikalisch-Technische Bundesanstalt, Braunschweig, Director of the Department of Nano- and Micrometrology

G�nter Wilkening received his Ph.D. in Solid State Physics from the Technical University of Braunschweig, Germany, in 1977. In 1978, he joined the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), where he conducts research in the fields of force measurement and dimensional measurements in the micro- and nanometre range. Since 1988 he has been involved in Scanning Probe Microscopy and its use for quantitative measurements. In 1994, Professor Wilkening became head of the Nano- and Micrometrology Department. He is an active member of a number of national and international committees.
Ludger Koenders, Dr.
Physikalisch-Technische Bundesanstalt, Braunschweig, Layer Thickness and Nanostructures Department

Ludger Koenders is head of the Film Thickness and Nanostructures Research Group at the National Metrology Institute (Technische Bundesanstalt PTB) in Braunschweig, Germany. He received his Diploma and his Ph.D. in Physics from the University of Duisburg. For his Ph.D. thesis he investigated the adsorption of hydrogen and oxygen on III-V semiconductor surfaces using surface analytical techniques (AES, EELS, UPS, XPS) and resonant Raman spectroscopy. He joined the National Metrology Institute in 1989 and has worked on investigations of tip-sample effects in STM, on the development metrological SPM and of transfer standards for SPM. He has co-ordinated several international comparisons in the field of step height and surface roughness measurements.

"About this title" may belong to another edition of this title.

Buy New View Book
List Price: US$ 297.00
US$ 109.62

Convert Currency

Shipping: US$ 4.95
Within U.S.A.

Destination, Rates & Speeds

Add to Basket

Top Search Results from the AbeBooks Marketplace

1.

GŁnter Wilkening; Ludger Koenders
ISBN 10: 352740502X ISBN 13: 9783527405022
New Quantity Available: 1
Seller:
BennettBooksLtd
(San Diego, CA, U.S.A.)
Rating
[?]

Book Description Condition: New. New. Seller Inventory # S-352740502X

More information about this seller | Contact this seller

Buy New
US$ 109.62
Convert Currency

Add to Basket

Shipping: US$ 4.95
Within U.S.A.
Destination, Rates & Speeds

2.

Günter Wilkening, Ludger Koenders
Published by Wiley-VCH (2005)
ISBN 10: 352740502X ISBN 13: 9783527405022
New Hardcover Quantity Available: 1
Seller:
Ergodebooks
(RICHMOND, TX, U.S.A.)
Rating
[?]

Book Description Wiley-VCH, 2005. Hardcover. Condition: New. Seller Inventory # DADAX352740502X

More information about this seller | Contact this seller

Buy New
US$ 173.52
Convert Currency

Add to Basket

Shipping: US$ 3.99
Within U.S.A.
Destination, Rates & Speeds

3.

Günter Wilkening; Ludger Koenders
Published by Wiley-VCH (2005)
ISBN 10: 352740502X ISBN 13: 9783527405022
New Hardcover Quantity Available: 1
Seller:
Irish Booksellers
(Portland, ME, U.S.A.)
Rating
[?]

Book Description Wiley-VCH, 2005. Condition: New. book. Seller Inventory # M352740502X

More information about this seller | Contact this seller

Buy New
US$ 219.11
Convert Currency

Add to Basket

Shipping: FREE
Within U.S.A.
Destination, Rates & Speeds

4.

Gunter Wilkening
Published by Wiley VCH (2005)
ISBN 10: 352740502X ISBN 13: 9783527405022
New Quantity Available: 1
Seller:
Books2Anywhere
(Fairford, GLOS, United Kingdom)
Rating
[?]

Book Description Wiley VCH, 2005. HRD. Condition: New. New Book. Shipped from UK in 4 to 14 days. Established seller since 2000. Seller Inventory # FW-9783527405022

More information about this seller | Contact this seller

Buy New
US$ 234.18
Convert Currency

Add to Basket

Shipping: US$ 11.94
From United Kingdom to U.S.A.
Destination, Rates & Speeds

5.

Günter Wilkening (author), Ludger Koenders (author)
Published by Wiley 2005-02-15, Weinheim :|Chichester (2005)
ISBN 10: 352740502X ISBN 13: 9783527405022
New Hardcover Quantity Available: 1
Seller:
Blackwell's
(Oxford, OX, United Kingdom)
Rating
[?]

Book Description Wiley 2005-02-15, Weinheim :|Chichester, 2005. hardback. Condition: New. Seller Inventory # 9783527405022

More information about this seller | Contact this seller

Buy New
US$ 247.84
Convert Currency

Add to Basket

Shipping: US$ 7.96
From United Kingdom to U.S.A.
Destination, Rates & Speeds

6.

Koenders Ludger Wilkening G?nter
Published by John Wiley & Sons
ISBN 10: 352740502X ISBN 13: 9783527405022
New Quantity Available: 4
Seller:
Majestic Books
(London, ,, United Kingdom)
Rating
[?]

Book Description John Wiley & Sons. Condition: New. pp. 541. Seller Inventory # 7372071

More information about this seller | Contact this seller

Buy New
US$ 321.33
Convert Currency

Add to Basket

Shipping: US$ 7.29
From United Kingdom to U.S.A.
Destination, Rates & Speeds

7.

Günter Wilkening
Published by Wiley VCH Verlag GmbH (2005)
ISBN 10: 352740502X ISBN 13: 9783527405022
New Hardcover Quantity Available: 1
Seller:
Rating
[?]

Book Description Wiley VCH Verlag GmbH, 2005. Condition: New. Seller Inventory # L9783527405022

More information about this seller | Contact this seller

Buy New
US$ 342.41
Convert Currency

Add to Basket

Shipping: US$ 3.49
From Germany to U.S.A.
Destination, Rates & Speeds

8.

Günter Wilkening
Published by Wiley VCH Verlag Gmbh Mai 2005 (2005)
ISBN 10: 352740502X ISBN 13: 9783527405022
New Quantity Available: 1
Seller:
Rating
[?]

Book Description Wiley VCH Verlag Gmbh Mai 2005, 2005. Buch. Condition: Neu. Neuware - The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar 'NanoScale 2004' (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing 519 pp. Englisch. Seller Inventory # 9783527405022

More information about this seller | Contact this seller

Buy New
US$ 342.41
Convert Currency

Add to Basket

Shipping: US$ 14.00
From Germany to U.S.A.
Destination, Rates & Speeds

9.

Günter Wilkening
Published by Wiley VCH Verlag Gmbh Mai 2005 (2005)
ISBN 10: 352740502X ISBN 13: 9783527405022
New Quantity Available: 1
Seller:
BuchWeltWeit Inh. Ludwig Meier e.K.
(Bergisch Gladbach, Germany)
Rating
[?]

Book Description Wiley VCH Verlag Gmbh Mai 2005, 2005. Buch. Condition: Neu. Neuware - The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar 'NanoScale 2004' (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing 519 pp. Englisch. Seller Inventory # 9783527405022

More information about this seller | Contact this seller

Buy New
US$ 342.41
Convert Currency

Add to Basket

Shipping: US$ 19.98
From Germany to U.S.A.
Destination, Rates & Speeds

10.

Günter Wilkening
Published by Wiley VCH Verlag Gmbh Mai 2005 (2005)
ISBN 10: 352740502X ISBN 13: 9783527405022
New Quantity Available: 1
Seller:
Rheinberg-Buch
(Bergisch Gladbach, Germany)
Rating
[?]

Book Description Wiley VCH Verlag Gmbh Mai 2005, 2005. Buch. Condition: Neu. Neuware - The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar 'NanoScale 2004' (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing 519 pp. Englisch. Seller Inventory # 9783527405022

More information about this seller | Contact this seller

Buy New
US$ 342.41
Convert Currency

Add to Basket

Shipping: US$ 20.12
From Germany to U.S.A.
Destination, Rates & Speeds

There are more copies of this book

View all search results for this book